TREA

Udo Weigel

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  • Munich, DE
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Patents Grantslast 30 patents

  • Information Patent Grant

    Ultra high precision measurement tool
    • Patent number 8,785,849
    • Issue date Jul 22, 2014
    • ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnick mbH
    • Juergen Frosien
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle source with automated tip formation
    • Patent number 8,330,130
    • Issue date Dec 11, 2012
    • ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
    • Dieter Winkler
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Stable emission gas ion source and method for operation thereof
    • Patent number 8,143,589
    • Issue date Mar 27, 2012
    • ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
    • Dieter Winkler
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Modular gas ion source
    • Patent number 8,101,922
    • Issue date Jan 24, 2012
    • ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
    • Dieter Winkler
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents