Uihui Kwon

Person

Hwaseong-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 12,191,368
- Issue date Jan 7, 2025
- Samsung Electronics Co., Ltd.
- Yonghee Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor protection device
- Patent number 12,002,890
- Issue date Jun 4, 2024
- Samsung Electronics Co., Ltd.
- Jaehyun Yoo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for estimating aging of integrated circuit
- Patent number 11,972,185
- Issue date Apr 30, 2024
- Samsung Electronics Co., Ltd.
- Jaehee Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit device
- Patent number 11,888,039
- Issue date Jan 30, 2024
- Samsung Electronics Co., Ltd.
- Yonghee Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal oxide semiconductor field-effect transistor (MOSFET) devices...
- Patent number 11,791,394
- Issue date Oct 17, 2023
- Samsung Electronics Co., Ltd.
- Sangjun Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and electronic device for guiding semiconductor manufacturin...
- Patent number 11,693,386
- Issue date Jul 4, 2023
- SAMSUNG ELEOTRONICS CO., LTD.
- Jaeho Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image sensors having grating structures therein that provide enhanc...
- Patent number 11,658,194
- Issue date May 23, 2023
- Samsung Electronics Co., Ltd.
- Wook Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal oxide semiconductor field-effect transistor (MOSFET) devices...
- Patent number 11,522,064
- Issue date Dec 6, 2022
- Samsung Electronics Co., Ltd.
- Sangjun Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image sensor
- Patent number 11,222,918
- Issue date Jan 11, 2022
- Samsung Electronics Co., Ltd.
- Sungchul Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Standard cell design system, standard cell design optimization meth...
- Patent number 10,796,068
- Issue date Oct 6, 2020
- Samsung Electronics Co., Ltd.
- Uihui Kwon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simulation system estimating self-heating characteristic of circuit...
- Patent number 10,216,876
- Issue date Feb 26, 2019
- Samsung Electronics Co., Ltd.
- Jongwook Jeon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor devices having tapered active regions
- Patent number 9,634,092
- Issue date Apr 25, 2017
- Samsung Electronics Co., Ltd.
- Krishna Kumar Bhuwalka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET semiconductor device and method of manufacturing the same
- Patent number 9,130,040
- Issue date Sep 8, 2015
- Samsung Electronics Co., Ltd.
- JaeHoo Park
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
IMAGE SENSOR AND MANUFACTURING METHOD THEREOF
- Publication number 20240170520
- Publication date May 23, 2024
- SAMSUNG ELECTRONICSCO., LTD.
- SUNGCHUL KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DEVICE
- Publication number 20240113182
- Publication date Apr 4, 2024
- Samsung Electronics Co., Ltd.
- Yonghee PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR
- Publication number 20230352509
- Publication date Nov 2, 2023
- Samsung Electronics Co., Ltd.
- Seonghoon KO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR
- Publication number 20230282662
- Publication date Sep 7, 2023
- Samsung Electronics Co., Ltd.
- KWANGHEE LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSORS HAVING GRATING STRUCTURES THEREIN THAT PROVIDE ENHANC...
- Publication number 20230246050
- Publication date Aug 3, 2023
- Samsung Electronics Co., Ltd.
- Wook Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL OXIDE SEMICONDUCTOR FIELD-EFFECT TRANSISTOR (MOSFET) DEVICES...
- Publication number 20230068212
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- SANGJUN YUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PROTECTION DEVICE
- Publication number 20220376119
- Publication date Nov 24, 2022
- Samsung Electronics Co., Ltd.
- Jaehyun YOO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20220285511
- Publication date Sep 8, 2022
- Samsung Electronics Co., Ltd.
- Yonghee Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DEVICE
- Publication number 20220165857
- Publication date May 26, 2022
- Samsung Electronics Co., Ltd.
- Yonghee PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL OXIDE SEMICONDUCTOR FIELD-EFFECT TRANSISTOR (MOSFET) DEVICES...
- Publication number 20210336026
- Publication date Oct 28, 2021
- Samsung Electronics Co., Ltd.
- SANGJUN YUN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR ESTIMATING AGING OF INTEGRATED CIRCUIT
- Publication number 20210165940
- Publication date Jun 3, 2021
- Samsung Electronics Co., Ltd.
- Jaehee Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND ELECTRONIC DEVICE FOR GUIDING SEMICONDUCTOR MANUFACTURIN...
- Publication number 20210063999
- Publication date Mar 4, 2021
- Samsung Electronics Co., Ltd.
- Jaeho KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STANDARD CELL DESIGN SYSTEM, STANDARD CELL DESIGN OPTIMIZATION METH...
- Publication number 20200082051
- Publication date Mar 12, 2020
- Samsung Electronics Co., Ltd.
- Uihui Kwon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE SENSORS HAVING GRATING STRUCTURES THEREIN THAT PROVIDE ENHANC...
- Publication number 20200075656
- Publication date Mar 5, 2020
- Samsung Electronics Co., Ltd.
- Wook Lee
- G02 - OPTICS
Information Patent Application
SIMULATION SYSTEM ESTIMATING SELF-HEATING CHARACTERISTIC OF CIRCUIT...
- Publication number 20190294748
- Publication date Sep 26, 2019
- Samsung Electronics Co., Ltd.
- JONGWOOK JEON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIMULATION SYSTEM ESTIMATING SELF-HEATING CHARACTERISTIC OF CIRCUIT...
- Publication number 20190130059
- Publication date May 2, 2019
- Samsung Electronics Co., Ltd.
- JONGWOOK JEON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICES HAVING TAPERED ACTIVE REGIONS
- Publication number 20160254348
- Publication date Sep 1, 2016
- Krishna Kumar BHUWALKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING PATTERN OF SEMICONDUCTOR DEVICE AND SEMICONDUCTO...
- Publication number 20160086841
- Publication date Mar 24, 2016
- Samsung Electronics Co., Ltd.
- SEUNGHYUN SONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIMULATION SYSTEM ESTIMATING SELF-HEATING CHARACTERISTIC OF CIRCUIT...
- Publication number 20160048622
- Publication date Feb 18, 2016
- JONGWOOK JEON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20140332863
- Publication date Nov 13, 2014
- Samsung Electronics Co., Ltd.
- JaeHoo PARK
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Semiconductor device

Semiconductor protection device

Method and apparatus for estimating aging of integrated circuit

Integrated circuit device

Metal oxide semiconductor field-effect transistor (MOSFET) devices...

Method and electronic device for guiding semiconductor manufacturin...

Image sensors having grating structures therein that provide enhanc...

Metal oxide semiconductor field-effect transistor (MOSFET) devices...

Image sensor

Standard cell design system, standard cell design optimization meth...

Simulation system estimating self-heating characteristic of circuit...

Semiconductor devices having tapered active regions

FinFET semiconductor device and method of manufacturing the same

Patents Applicationslast 30 patents

IMAGE SENSOR AND MANUFACTURING METHOD THEREOF

INTEGRATED CIRCUIT DEVICE

IMAGE SENSOR

IMAGE SENSOR

IMAGE SENSORS HAVING GRATING STRUCTURES THEREIN THAT PROVIDE ENHANC...

METAL OXIDE SEMICONDUCTOR FIELD-EFFECT TRANSISTOR (MOSFET) DEVICES...

SEMICONDUCTOR PROTECTION DEVICE

SEMICONDUCTOR DEVICE

INTEGRATED CIRCUIT DEVICE

METAL OXIDE SEMICONDUCTOR FIELD-EFFECT TRANSISTOR (MOSFET) DEVICES...

METHOD AND APPARATUS FOR ESTIMATING AGING OF INTEGRATED CIRCUIT

METHOD AND ELECTRONIC DEVICE FOR GUIDING SEMICONDUCTOR MANUFACTURIN...

STANDARD CELL DESIGN SYSTEM, STANDARD CELL DESIGN OPTIMIZATION METH...

IMAGE SENSORS HAVING GRATING STRUCTURES THEREIN THAT PROVIDE ENHANC...

SIMULATION SYSTEM ESTIMATING SELF-HEATING CHARACTERISTIC OF CIRCUIT...

SIMULATION SYSTEM ESTIMATING SELF-HEATING CHARACTERISTIC OF CIRCUIT...

SEMICONDUCTOR DEVICES HAVING TAPERED ACTIVE REGIONS

METHOD FOR FORMING PATTERN OF SEMICONDUCTOR DEVICE AND SEMICONDUCTO...

SIMULATION SYSTEM ESTIMATING SELF-HEATING CHARACTERISTIC OF CIRCUIT...

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME