Uki IKEDA

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus
- Patent number 11,749,497
- Issue date Sep 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Shunsuke Mizutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,694,873
- Issue date Jul 4, 2023
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi Sekiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,515,120
- Issue date Nov 29, 2022
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi Sekiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle beam apparatus
- Patent number 11,282,671
- Issue date Mar 22, 2022
- HITACHI HIGH-TECH CORPORATION
- Uki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,139,144
- Issue date Oct 5, 2021
- HITACHI HIGH-TECH CORPORATION
- Shunsuke Mizutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measuring method, pattern measuring tool and computer reada...
- Patent number 10,903,041
- Issue date Jan 26, 2021
- HITACHI HIGH-TECH CORPORATION
- Uki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20230030651
- Publication date Feb 2, 2023
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi SEKIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20210375583
- Publication date Dec 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Shunsuke MIZUTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210183614
- Publication date Jun 17, 2021
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi SEKIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Charged-Particle Beam Apparatus
- Publication number 20200185189
- Publication date Jun 11, 2020
- Hitachi High-Technologies Corporation
- Uki IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Measuring Method, Pattern Measuring Tool and Computer Reada...
- Publication number 20190378679
- Publication date Dec 12, 2019
- Hitachi High-Technologies Corporation
- Uki IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20190355552
- Publication date Nov 21, 2019
- Hitachi High-Technologies Corporation
- Shunsuke MIZUTANI
- H01 - BASIC ELECTRIC ELEMENTS