Ulf Hackius

Person

Dresden, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Modular prober and method for operating same
- Patent number 9,194,885
- Issue date Nov 24, 2015
- Cascade Microtech, Inc.
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement and method for focusing a multiplane image acquisition...
- Patent number 8,072,586
- Issue date Dec 6, 2011
- Cascade Microtech, Inc.
- Michael Teich
- G02 - OPTICS
Information Patent Grant
Method for measurement of a device under test
- Patent number 7,573,283
- Issue date Aug 11, 2009
- SUSS Micro Tec Test Systems GmbH
- Axel Schmidt
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE SYSTEMS AND METHODS INCLUDING ACTIVE ENVIRONMENTAL CONTROL
- Publication number 20170248973
- Publication date Aug 31, 2017
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Application
MODULAR PROBER AND METHOD FOR OPERATING SAME
- Publication number 20140145743
- Publication date May 29, 2014
- CASCADE MICOTECH, INC.
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION...
- Publication number 20110013011
- Publication date Jan 20, 2011
- SUSS MicroTec Test Systems GmbH
- Michael Teich
- G02 - OPTICS
Information Patent Application
METHOD FOR MEASUREMENT OF A DEVICE UNDER TEST
- Publication number 20080315903
- Publication date Dec 25, 2008
- SUSS MicroTec Test Systems GmbH
- Axel SCHMIDT
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CONTROL OF A POSITIONING DEVICE
- Publication number 20080284457
- Publication date Nov 20, 2008
- SUSS MicroTec Test Systems GmbH
- Ulf HACKIUS
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION...
- Publication number 20080212078
- Publication date Sep 4, 2008
- SUSS Micro Tec Test Systems GmbH
- Michael Teich
- G02 - OPTICS
Information Patent Application
PROCESS FOR THE INSPECTION OF A VARIETY OF REPETITIVE STRUCTURES
- Publication number 20070064992
- Publication date Mar 22, 2007
- SUSS MicroTec Test Systems GmbH
- Michael Teich
- G06 - COMPUTING CALCULATING COUNTING

Ulf Hackius

Person

Patents Grantslast 30 patents

Modular prober and method for operating same

Arrangement and method for focusing a multiplane image acquisition...

Method for measurement of a device under test

Patents Applicationslast 30 patents

PROBE SYSTEMS AND METHODS INCLUDING ACTIVE ENVIRONMENTAL CONTROL

MODULAR PROBER AND METHOD FOR OPERATING SAME

ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION...

METHOD FOR MEASUREMENT OF A DEVICE UNDER TEST

METHOD AND APPARATUS FOR CONTROL OF A POSITIONING DEVICE

ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION...

PROCESS FOR THE INSPECTION OF A VARIETY OF REPETITIVE STRUCTURES