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Ulrich Benner
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Trostberg, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Optical position-measuring device
Patent number
10,060,765
Issue date
Aug 28, 2018
Dr. Johannes Heidenhain GmbH
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Grant
Rotary position measuring instrument
Patent number
8,937,726
Issue date
Jan 20, 2015
Dr, Johannes Heidenhain GmbH
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Grant
Position-measuring device
Patent number
8,854,630
Issue date
Oct 7, 2014
Dr. Johannes Heidenhain GmbH
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Grant
Position measuring device
Patent number
8,570,621
Issue date
Oct 29, 2013
Dr. Johannes Heidenhain GmbH
Jan Braasch
G01 - MEASURING TESTING
Information
Patent Grant
Optical position measuring device
Patent number
8,537,370
Issue date
Sep 17, 2013
Dr. Johannes Heidenhain GmbH
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Grant
Scanning unit for an optical position-measuring device
Patent number
7,705,289
Issue date
Apr 27, 2010
Dr. Johannes Heidenhain GmbH
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Grant
Position-measuring device
Patent number
7,473,886
Issue date
Jan 6, 2009
Dr. Johannes Heidenhain GmbH
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Grant
Scanning unit for a position measuring system for the optical scann...
Patent number
7,423,768
Issue date
Sep 9, 2008
Dr. Johannes Heidenhain GmbH
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Grant
Scanning unit for a position measuring instrument for optical scann...
Patent number
7,230,726
Issue date
Jun 12, 2007
Dr. Johannes Heidenhain GmbH
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Grant
Position measuring system
Patent number
7,164,482
Issue date
Jan 16, 2007
Dr. Johannes Heidenhain GmbH
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Grant
Interferential position measuring arrangement
Patent number
7,154,609
Issue date
Dec 26, 2006
Johannes Heidenhain GmbH
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Grant
Optical position measuring device
Patent number
6,963,409
Issue date
Nov 8, 2005
Dr. Johannes Heidenhain GmbH
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Grant
Position measuring system and method for operating a position measu...
Patent number
6,914,235
Issue date
Jul 5, 2005
Dr. Johannes Heidenhain GmbH
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Grant
Scale and position measuring system for absolute position determina...
Patent number
6,742,275
Issue date
Jun 1, 2004
Dr. Johannes Heidenhain GmbH
Elmar Mayer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL POSITION-MEASURING DEVICE
Publication number
20170370749
Publication date
Dec 28, 2017
Dr. Johannes Heidenhain Gmbh
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Application
ROTARY POSITION MEASURING INSTRUMENT
Publication number
20130063732
Publication date
Mar 14, 2013
Dr. Johannes Heidenhain GmbH
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Application
Position-Measuring Device
Publication number
20120081711
Publication date
Apr 5, 2012
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Application
POSITION MEASURING DEVICE
Publication number
20110261422
Publication date
Oct 27, 2011
Jan Braasch
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL POSITION MEASURING DEVICE
Publication number
20110109917
Publication date
May 12, 2011
Johanes Heidenhain GmbH
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Application
SCANNING UNIT FOR AN OPTICAL POSITION-MEASURING DEVICE
Publication number
20080315077
Publication date
Dec 25, 2008
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Application
Position-measuring device
Publication number
20070262250
Publication date
Nov 15, 2007
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Application
Scanning unit for a position measuring system for the optical scann...
Publication number
20060227341
Publication date
Oct 12, 2006
Dr. Johannes Heidenhain GmbH
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Application
Optical position measuring device
Publication number
20050168757
Publication date
Aug 4, 2005
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Application
Scanning unit for position measuring instrument for optical scannin...
Publication number
20040246500
Publication date
Dec 9, 2004
Dr. Johannes Heidenhain GmbH
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Application
Position measuring system
Publication number
20040227958
Publication date
Nov 18, 2004
Dr. Johannes Heidenhain GmbH
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Application
Interferential position measuring arrangement
Publication number
20040090637
Publication date
May 13, 2004
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Application
Scale and position measuring system for absolute position determina...
Publication number
20030145479
Publication date
Aug 7, 2003
Elmar Mayer
H03 - BASIC ELECTRONIC CIRCUITRY