Ulrich D. Keil

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Warren, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Al.sub.x Ga.sub.1-x as probe for use in electro-optic sampling
- Patent number 5,406,194
- Issue date Apr 11, 1995
- AT&T Corp.
- Douglas R. Dykaar
- G01 - MEASURING TESTING