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Ulrike Kindereit
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San Diego, CA, US
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last 30 patents
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Patent Application
PHYSICAL LAYOUT FEATURES OF INTEGRATED CIRCUIT DEVICE TO ENHANCE OP...
Publication number
20150380325
Publication date
Dec 31, 2015
QUALCOMM Incorporated
Ulrike KINDEREIT
G01 - MEASURING TESTING
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Patent Application
APPARATUS FOR TEMPERATURE CONTROLLED ELECTRICAL AND OPTICAL PROBE F...
Publication number
20140361799
Publication date
Dec 11, 2014
QUALCOMM Incorporated
Armand Anthony Graupera
G01 - MEASURING TESTING