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Umberto Celano
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Kessel-Lo, BE
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Patents Grants
last 30 patents
Information
Patent Grant
Device for measuring surface characteristics of a material
Patent number
11,125,805
Issue date
Sep 21, 2021
Imec VZW
Kristof Paredis
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for transmission electron microscopy
Patent number
10,541,108
Issue date
Jan 21, 2020
Imec VZW
Umberto Celano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device and method for two dimensional active carrier profiling of s...
Patent number
10,495,666
Issue date
Dec 3, 2019
Imec VZW
Kristof Paredis
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DEVICE FOR MEASURING SURFACE CHARACTERISTICS OF A MATERIAL
Publication number
20200033395
Publication date
Jan 30, 2020
IMEC vzw
Kristof Paredis
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR TWO DIMENSIONAL ACTIVE CARRIER PROFILING OF S...
Publication number
20190025341
Publication date
Jan 24, 2019
IMEC vzw
Kristof Paredis
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR TRANSMISSION ELECTRON MICROSCOPY
Publication number
20180240642
Publication date
Aug 23, 2018
IMEC vzw
Umberto Celano
H01 - BASIC ELECTRIC ELEMENTS