Umesh ADIGA

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Shape invariant method for accurate fiducial finding
- Patent number 12,254,645
- Issue date Mar 18, 2025
- FEI Company
- Umesh Adiga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology of semiconductor devices in electron micrographs using fa...
- Patent number 11,947,270
- Issue date Apr 2, 2024
- FEI Company
- Umesh Adiga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart metrology on microscope images
- Patent number 11,494,914
- Issue date Nov 8, 2022
- FEI Company
- Umesh Adiga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart metrology on microscope images
- Patent number 10,748,290
- Issue date Aug 18, 2020
- FEI Company
- Umesh Adiga
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATED REGION SELECTION FOR AUTO SWEEP
- Publication number 20250095159
- Publication date Mar 20, 2025
- FEI Company
- Umesh ADIGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADAPTIVE AND RETROSPECTIVE ENDPOINT DETECTION FOR AUTOMATED DELAYER...
- Publication number 20240094142
- Publication date Mar 21, 2024
- FEI Company
- Sophia E. Weeks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR HYBRID ENHANCEMENT OF SCANNING ELECTRON MIC...
- Publication number 20230260085
- Publication date Aug 17, 2023
- FEI Company
- Umesh ADIGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPE INVARIANT METHOD FOR ACCURATE FIDUCIAL FINDING
- Publication number 20230177715
- Publication date Jun 8, 2023
- FEI Company
- Umesh Adiga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY OF SEMICONDUCTOR DEVICES IN ELECTRON MICROGRAPHS USING FA...
- Publication number 20210263430
- Publication date Aug 26, 2021
- FEI Company
- Umesh ADIGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SMART METROLOGY ON MICROSCOPE IMAGES
- Publication number 20200349713
- Publication date Nov 5, 2020
- FEI Company
- Umesh ADIGA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SMART METROLOGY ON MICROSCOPE IMAGES
- Publication number 20200134824
- Publication date Apr 30, 2020
- FEI Company
- Umesh ADIGA
- G06 - COMPUTING CALCULATING COUNTING

Umesh ADIGA

Person

Patents Grantslast 30 patents

Shape invariant method for accurate fiducial finding

Metrology of semiconductor devices in electron micrographs using fa...

Smart metrology on microscope images

Smart metrology on microscope images

Patents Applicationslast 30 patents

AUTOMATED REGION SELECTION FOR AUTO SWEEP

ADAPTIVE AND RETROSPECTIVE ENDPOINT DETECTION FOR AUTOMATED DELAYER...

SYSTEMS AND METHODS FOR HYBRID ENHANCEMENT OF SCANNING ELECTRON MIC...

SHAPE INVARIANT METHOD FOR ACCURATE FIDUCIAL FINDING

METROLOGY OF SEMICONDUCTOR DEVICES IN ELECTRON MICROGRAPHS USING FA...

SMART METROLOGY ON MICROSCOPE IMAGES

SMART METROLOGY ON MICROSCOPE IMAGES