Umesh Chandra Srivastava

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Greater Noida, IN

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Patents Grantslast 30 patents

Information Patent Grant
Area, cost, and time-effective scan coverage improvement
- Patent number 12,366,605
- Issue date Jul 22, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Venkata Narayanan Srinivasan
- G01 - MEASURING TESTING
Information Patent Grant
Test pattern generation using multiple scan enables
- Patent number 12,345,764
- Issue date Jul 1, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Shiv Kumar Vats
- G01 - MEASURING TESTING
Information Patent Grant
TVF transition coverage with self-test and production-test time red...
- Patent number 12,146,911
- Issue date Nov 19, 2024
- STMICROELECTRONICS INTERNATIONAL N.V.
- Venkata Narayanan Srinivasan
- G01 - MEASURING TESTING
Information Patent Grant
Circuit and method for scan testing
- Patent number 11,714,131
- Issue date Aug 1, 2023
- STMICROELECTRONICS INTERNATIONAL N.V.
- Venkata Narayanan Srinivasan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST PATTERN GENERATION USING MULTIPLE SCAN ENABLES
- Publication number 20240426907
- Publication date Dec 26, 2024
- STMicroelectronics International N.V.
- Shiv Kumar Vats
- G01 - MEASURING TESTING
Information Patent Application
POWER REDUCTION AND EFFECTIVE TIMING EXCEPTIONS HANDLING IN AT-SPEE...
- Publication number 20240427366
- Publication date Dec 26, 2024
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TVF TRANSITION COVERAGE WITH SELF-TEST AND PRODUCTION-TEST TIME RED...
- Publication number 20240402249
- Publication date Dec 5, 2024
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- G01 - MEASURING TESTING
Information Patent Application
AREA, COST, AND TIME-EFFECTIVE SCAN COVERAGE IMPROVEMENT
- Publication number 20240250668
- Publication date Jul 25, 2024
- STMicroelectronics International N.V.
- Venkata Narayanan Srinivasan
- H03 - BASIC ELECTRONIC CIRCUITRY