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UNG DO PARK
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SEOUL, KR
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Patents Grants
last 30 patents
Information
Patent Grant
MEMS probe and test device using the same
Patent number
11,408,914
Issue date
Aug 9, 2022
LEENO INDUSTRIAL INC.
Ung-gi Park
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test probe and test device using the same
Patent number
10,670,628
Issue date
Jun 2, 2020
LEENO INDUSTRIAL INC.
Ung-gi Park
G01 - MEASURING TESTING
Information
Patent Grant
Test device
Patent number
10,656,180
Issue date
May 19, 2020
LEENO INDUSTRIAL INC.
Ung-gi Park
G01 - MEASURING TESTING
Information
Patent Grant
Probe card
Patent number
7,733,103
Issue date
Jun 8, 2010
Mico TN Ltd.
Ung-Gi Park
G01 - MEASURING TESTING
Information
Patent Grant
Probe card locking device of a semiconductor wafer probe station
Patent number
5,644,246
Issue date
Jul 1, 1997
Hyundai Electronics Industries Co., Ltd.
Dong-Seck Lee
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MEMS PROBE AND TEST DEVICE USING THE SAME
Publication number
20190064215
Publication date
Feb 28, 2019
Leeno Industrial Inc.
Ung-gi Park
G01 - MEASURING TESTING
Information
Patent Application
TEST DEVICE
Publication number
20190041430
Publication date
Feb 7, 2019
Leeno Industrial Inc.
Ung-gi Park
G01 - MEASURING TESTING
Information
Patent Application
TEST PROBE AND TEST DEVICE USING THE SAME
Publication number
20190041428
Publication date
Feb 7, 2019
LEENO INDUSTRIAL INC.
Ung-gi Park
G01 - MEASURING TESTING
Information
Patent Application
BROADBAND MONITORING CAMERA
Publication number
20140293061
Publication date
Oct 2, 2014
CHAN DUK PARK
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
BROADBAND MONITORING CAMERA
Publication number
20120217356
Publication date
Aug 30, 2012
Chan Duk Park
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
PROBE CARD
Publication number
20080079452
Publication date
Apr 3, 2008
Ung-Gi Park
G01 - MEASURING TESTING