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Ung-Jin JANG
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Daejeon, KR
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Patents Grants
last 30 patents
Information
Patent Grant
Test apparatus which tests semiconductor chips
Patent number
11,506,740
Issue date
Nov 22, 2022
Samsung Electronics Co., Ltd.
Ung Jin Jang
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus which tests semiconductor chips
Patent number
10,955,513
Issue date
Mar 23, 2021
Samsung Electronics Co., Ltd.
Ung Jin Jang
G01 - MEASURING TESTING
Information
Patent Grant
Test board, test equipment, test system, and test method
Patent number
10,203,369
Issue date
Feb 12, 2019
Samsung Electronics Co., Ltd.
Joo-sung Yun
G01 - MEASURING TESTING
Information
Patent Grant
Test device and test system including the same
Patent number
9,612,276
Issue date
Apr 4, 2017
Samsung Electronics Co., Ltd.
Jong-Woon Yoo
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and test apparatus including the same
Patent number
8,872,531
Issue date
Oct 28, 2014
Samsung Electronics Co., Ltd.
Ki-jae Song
G11 - INFORMATION STORAGE
Information
Patent Grant
Driving apparatus of display device for gray range extension, displ...
Patent number
8,035,661
Issue date
Oct 11, 2011
Samsung Electronics Co., Ltd.
Il-Pyung Lee
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Patents Applications
last 30 patents
Information
Patent Application
TEST APPARATUS WHICH TESTS SEMICONDUCTOR CHIPS
Publication number
20210181288
Publication date
Jun 17, 2021
Samsung Electronics Co., Ltd.
UNG JIN JANG
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS WHICH TESTS SEMICONDUCTOR CHIPS
Publication number
20180031668
Publication date
Feb 1, 2018
Samsung Electronics Co., Ltd.
UNG JIN JANG
G01 - MEASURING TESTING
Information
Patent Application
TEST BOARD, TEST EQUIPMENT, TEST SYSTEM, AND TEST METHOD
Publication number
20170023638
Publication date
Jan 26, 2017
Joo-sung YUN
G01 - MEASURING TESTING
Information
Patent Application
TEST DEVICE AND TEST SYSTEM INCLUDING THE SAME
Publication number
20150054532
Publication date
Feb 26, 2015
Samsung Electronics Co., Ltd.
Jong-Woon YOO
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE ON DEVICE INTERFACE BOARD AND TEST SYSTEM USIN...
Publication number
20140253099
Publication date
Sep 11, 2014
Samsung Electronics Co., Ltd.
Sang-Kyeong HAN
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND TEST APPARATUS INCLUDING THE SAME
Publication number
20110227593
Publication date
Sep 22, 2011
Ki-jae SONG
G01 - MEASURING TESTING
Information
Patent Application
DRIVING APPARATUS OF DISPLAY DEVICE, DISPLAY DEVICE INCLUDING THE S...
Publication number
20080246779
Publication date
Oct 9, 2008
Samsung Electronics Co., Ltd.
Il-Pyung LEE
G06 - COMPUTING CALCULATING COUNTING