UNGJIN JANG

Follow

Person

Asan-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Test devices, test systems, and operating methods of test systems
- Patent number 12,111,351
- Issue date Oct 8, 2024
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G11 - INFORMATION STORAGE
Information Patent Grant
Auxiliary test device, test board having the same, and test method...
- Patent number 10,262,753
- Issue date Apr 16, 2019
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TEST APPARATUS AND POWER SUPPLY METHOD THEREOF
- Publication number 20250044353
- Publication date Feb 6, 2025
- Samsung Electronics Co., Ltd.
- Ungjin Jang
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICES, TEST SYSTEMS, AND OPERATING METHODS OF TEST SYSTEMS
- Publication number 20220178997
- Publication date Jun 9, 2022
- Samsung Electronics Co., Ltd.
- Ungjin JANG
- G11 - INFORMATION STORAGE
Information Patent Application
AUXILIARY TEST DEVICE, TEST BOARD HAVING THE SAME, AND TEST METHOD...
- Publication number 20170010304
- Publication date Jan 12, 2017
- Ungjin Jang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM OF TESTING SEMICONDUCTOR MEMORY
- Publication number 20150058685
- Publication date Feb 26, 2015
- Samsung Electronics Co., Ltd.
- UNGJIN JANG
- G11 - INFORMATION STORAGE