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Uppili Sridhar
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Garland, TX, US
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last 30 patents
Information
Patent Grant
Offset pressure sensor
Patent number
5,412,994
Issue date
May 9, 1995
James D. Cook
G01 - MEASURING TESTING
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Patent Grant
Method for etching silicon
Patent number
5,360,521
Issue date
Nov 1, 1994
Honeywell Inc.
Richard A. Davis
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Grant
Hall effect element aligned to reduce package-induced offsets
Patent number
5,119,166
Issue date
Jun 2, 1992
Honeywell Inc.
Uppili Sridhar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Adhesion layer for platinum based sensors
Patent number
4,952,904
Issue date
Aug 28, 1990
Honeywell Inc.
Robert G. Johnson
G01 - MEASURING TESTING