Uri HADAR

Person

Tel Aviv, IL

People

Patents Applicationslast 30 patents

Information Patent Application
NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VI...
- Publication number 20250231132
- Publication date Jul 17, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VI...
- Publication number 20250216347
- Publication date Jul 3, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Uri Hadar
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...
- Publication number 20250130185
- Publication date Apr 24, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Uri Hadar
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATU...
- Publication number 20240255449
- Publication date Aug 1, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
- Publication number 20240094150
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
- Publication number 20240096591
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Z-PROFILING OF WAFERS BASED ON X-RAY MEASUREMENTS
- Publication number 20240085356
- Publication date Mar 14, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEPTH-PROFILING OF SAMPLES BASED ON X-RAY MEASUREMENTS
- Publication number 20240085351
- Publication date Mar 14, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPE LOCALIZATION FOR EXAMINING A SEMICONDUCTOR SPECIMEN
- Publication number 20240046445
- Publication date Feb 8, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Gilad VERED
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Applicationslast 30 patents

NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VI...

NONDESTRUCTIVE ESTIMATION OF STRUCTURAL PROPERTIES OF A SPECIMEN VI...

NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF S...

NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATU...

NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES

NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES

Z-PROFILING OF WAFERS BASED ON X-RAY MEASUREMENTS

DEPTH-PROFILING OF SAMPLES BASED ON X-RAY MEASUREMENTS

SHAPE LOCALIZATION FOR EXAMINING A SEMICONDUCTOR SPECIMEN