Uri HADAR

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Tel Aviv, IL

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Patents Applicationslast 30 patents

Information Patent Application
NON-DESTRUCTIVE CLASSIFICATION OF SPECIMENS BASED ON ENERGY SIGNATU...
- Publication number 20240255449
- Publication date Aug 1, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
- Publication number 20240094150
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-DESTRUCTIVE SEM-BASED DEPTH-PROFILING OF SAMPLES
- Publication number 20240096591
- Publication date Mar 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Z-PROFILING OF WAFERS BASED ON X-RAY MEASUREMENTS
- Publication number 20240085356
- Publication date Mar 14, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEPTH-PROFILING OF SAMPLES BASED ON X-RAY MEASUREMENTS
- Publication number 20240085351
- Publication date Mar 14, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Doron Girmonsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPE LOCALIZATION FOR EXAMINING A SEMICONDUCTOR SPECIMEN
- Publication number 20240046445
- Publication date Feb 8, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Gilad VERED
- G06 - COMPUTING CALCULATING COUNTING