Uri Lev

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Mazkeret Batya, IL

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Patents Grantslast 30 patents

Information Patent Grant
System and method for scanning an object with an electron beam usin...
- Patent number 10,541,104
- Issue date Jan 21, 2020
- Applied Materials Israel Ltd.
- Uri Lev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging of crystalline defects
- Patent number 10,347,462
- Issue date Jul 9, 2019
- Applied Materials Israel Ltd.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
IMAGING OF CRYSTALLINE DEFECTS
- Publication number 20190180975
- Publication date Jun 13, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Dror Shemesh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SCANNING AN OBJECT WITH AN ELECTRON BEAM
- Publication number 20170011883
- Publication date Jan 12, 2017
- APPLIED MATERIALS ISRAEL, LTD.
- Uri Lev
- H01 - BASIC ELECTRIC ELEMENTS