Membership
Tour
Register
Log in
Uri Mirsky
Follow
Person
Nofit, IL
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Device for electronic packaging, pin jig fixture
Patent number
6,670,704
Issue date
Dec 30, 2003
Micro Components Ltd.
Shimon Neftin
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Substrate for electronic packaging, pin jig fixture
Patent number
6,448,510
Issue date
Sep 10, 2002
Micro Components Ltd.
Shimon Neftin
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Patents Applications
last 30 patents
Information
Patent Application
MICROELECTRONIC INTERCONNECT SUBSTRATE AND PACKAGING TECHNIQUES
Publication number
20120273963
Publication date
Nov 1, 2012
Uri Mirsky
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
MICROELECTRONIC INTERCONNECT SUBSTRATE AND PACKAGING TECHNIQUES
Publication number
20120112238
Publication date
May 10, 2012
MICRO COMPONENTS LTD.
Uri Mirsky
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
INTERCONNECT SUBSTRATES, METHODS AND SYSTEMS THEREOF
Publication number
20100252306
Publication date
Oct 7, 2010
Micro Components Ltd.
Uri Mirsky
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
DEEP ANODIZATION
Publication number
20100255274
Publication date
Oct 7, 2010
Uri Mirsky
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
OPTICALLY MONITORING AN ALOX FABRICATION PROCESS
Publication number
20100078329
Publication date
Apr 1, 2010
Uri Mirsky
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
Microelectronic packaging and components
Publication number
20070126111
Publication date
Jun 7, 2007
Uri Mirsky
G01 - MEASURING TESTING
Information
Patent Application
Microelectronic packaging and components
Publication number
20060057866
Publication date
Mar 16, 2006
Uri Mirsky
G01 - MEASURING TESTING