Uwe Graf

Follow

Person

Solms, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for inspecting micro-structured devices on a s...
- Patent number 8,154,718
- Issue date Apr 10, 2012
- Vistec Semiconductor Systems GmbH
- Uwe Graf
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for inspecting an object
- Patent number 7,271,889
- Issue date Sep 18, 2007
- Leica Microsystems CMS GmbH
- Franz Cemic
- G01 - MEASURING TESTING
Information Patent Grant
Setting module for the illumination of an optical instrument
- Patent number 7,002,740
- Issue date Feb 21, 2006
- Leica Microsystems Jena GmbH
- Michael Veith
- G02 - OPTICS
Information Patent Grant
Autofocus module and method for a microscope-based system
- Patent number 6,879,440
- Issue date Apr 12, 2005
- Leica Microsystems Semiconductor GmbH
- Franz Cemic
- G02 - OPTICS
Information Patent Grant
Arrangement and method for illuminating a specimen field in an opti...
- Patent number 6,713,746
- Issue date Mar 30, 2004
- Leica Microsystems Jena GmbH
- Michael Veith
- G01 - MEASURING TESTING
Information Patent Grant
Method for focusing of disk-shaped objects with patterned surfaces...
- Patent number 6,696,679
- Issue date Feb 24, 2004
- Leica Microsystems Wetzlar GmbH
- Michael Graef
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and Method for Inspecting Microstructures in Reflected or...
- Publication number 20070247618
- Publication date Oct 25, 2007
- Vistec Semiconductor Systems GmbH
- Uwe Graf
- G02 - OPTICS
Information Patent Application
Device and method for inspecting an object
- Publication number 20050259245
- Publication date Nov 24, 2005
- LECIA MICROSYSTEMS SEMICONDUCTOR GmbH
- Franz Cemic
- G02 - OPTICS
Information Patent Application
Autofocus module and method for a microscope-based system
- Publication number 20030147134
- Publication date Aug 7, 2003
- Leica Microsystems Semiconductor GmbH
- Franz Cemic
- G02 - OPTICS
Information Patent Application
Arrangement and method for illuminating a specimen field in an opti...
- Publication number 20030015643
- Publication date Jan 23, 2003
- LEICA MICROSYSTEMS JENA GmbH
- Michael Veith
- G01 - MEASURING TESTING
Information Patent Application
Setting module for the illumination of an optical instrument
- Publication number 20030011882
- Publication date Jan 16, 2003
- LEICA MICROSYSTEMS JENA GmbH
- Michael Veith
- G02 - OPTICS