Uwe Hermes

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and system for controlling a surface profile of a wafer
- Patent number 10,654,193
- Issue date May 19, 2020
- GlobalWafers Co., Ltd.
- Peter D. Albrecht
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Methods and system for controlling a surface profile of a wafer
- Patent number 10,315,337
- Issue date Jun 11, 2019
- GlobalWafers Co. Ltd.
- Peter D. Albrecht
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and device for measuring the diffusion length of minority ca...
- Patent number 7,026,831
- Issue date Apr 11, 2006
- Uwe Hermes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEM FOR CONTROLLING A SURFACE PROFILE OF A WAFER
- Publication number 20190270222
- Publication date Sep 5, 2019
- GLOBALWAFERS CO., LTD.
- Peter D. Albrecht
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHODS AND SYSTEM FOR CONTROLLING A SURFACE PROFILE OF A WAFER
- Publication number 20180056545
- Publication date Mar 1, 2018
- SunEdison Semiconductor Limited (UEN201334164H)
- Peter D. Albrecht
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Application
Method and device for measuring the diffusion length of minority ca...
- Publication number 20050237080
- Publication date Oct 27, 2005
- Uwe Hermes
- G01 - MEASURING TESTING