Uwe Koeckritz

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Wafer arrangement, a method for testing a wafer, and a method for p...
- Patent number 10,056,305
- Issue date Aug 21, 2018
- Infineon Technologies Dresden GmbH
- Peter Brockhaus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer arrangement, a method for testing a wafer, and a method for p...
- Patent number 9,627,341
- Issue date Apr 18, 2017
- Infineon Technologies Dresden GmbH
- Peter Brockhaus
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
WAFER ARRANGEMENT, A METHOD FOR TESTING A WAFER, AND A METHOD FOR P...
- Publication number 20170213773
- Publication date Jul 27, 2017
- INFINEON TECHNOLOGIES DRESDEN GMBH
- Peter Brockhaus
- G01 - MEASURING TESTING
Information Patent Application
WAFER ARRANGEMENT, A METHOD FOR TESTING A WAFER, AND A METHOD FOR P...
- Publication number 20150115444
- Publication date Apr 30, 2015
- INFINEON TECHNOLOGIES DRESDEN GMBH
- Peter Brockhaus
- H01 - BASIC ELECTRIC ELEMENTS