Uwe Luecken

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method of investigating the wavefront of a charged-particle beam
- Patent number 9,202,670
- Issue date Dec 1, 2015
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of performing tomographic imaging of a sample in a charged-p...
- Patent number 8,912,491
- Issue date Dec 16, 2014
- FEI Company
- Remco Schoenmakers
- G01 - MEASURING TESTING
Information Patent Grant
Method for acquiring data with an image sensor
- Patent number 8,817,148
- Issue date Aug 26, 2014
- FEI Company
- Bart Jozef Janssen
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of measuring the temperature of a sample carrier in a charge...
- Patent number 8,757,873
- Issue date Jun 24, 2014
- FEI Company
- Stephanus Hubertus Leonardus van den Boom
- G01 - MEASURING TESTING
Information Patent Grant
Method of use for a multipole detector for a transmission electron...
- Patent number 8,692,196
- Issue date Apr 8, 2014
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of using a direct electron detector for a TEM
- Patent number 8,592,762
- Issue date Nov 26, 2013
- FEI Company
- Uwe Luecken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Distortion free stigmation of a TEM
- Patent number 8,569,693
- Issue date Oct 29, 2013
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector system for transmission electron microscope
- Patent number 8,338,782
- Issue date Dec 25, 2012
- FBI Company
- Uwe Luecken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for attaching a sample to a manipulator by melting and then...
- Patent number 7,845,245
- Issue date Dec 7, 2010
- FEI Company
- Michael Frederick Hayles
- G01 - MEASURING TESTING
Information Patent Grant
Method for obtaining a scanning transmission image of a sample in a...
- Patent number 7,825,378
- Issue date Nov 2, 2010
- FEI Company
- Alevtyna Yakushevska
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF INVESTIGATING THE WAVEFRONT OF A CHARGED-PARTICLE BEAM
- Publication number 20150170876
- Publication date Jun 18, 2015
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PERFORMING TOMOGRAPHIC IMAGING OF A SAMPLE IN A CHARGED-P...
- Publication number 20140145077
- Publication date May 29, 2014
- FEI Company
- Remco Schoenmakers
- G01 - MEASURING TESTING
Information Patent Application
Method of Preparing a Biological Sample for Inspection with Electro...
- Publication number 20130316365
- Publication date Nov 28, 2013
- FEI Company
- Elly van Donselaar
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ACQUIRING DATA WITH AN IMAGE SENSOR
- Publication number 20130093931
- Publication date Apr 18, 2013
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Distortion Free Stigmation of a TEM
- Publication number 20130062520
- Publication date Mar 14, 2013
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Measuring the Temperature of a Sample Carrier in a Charge...
- Publication number 20120128028
- Publication date May 24, 2012
- FEI Company
- Stephanus Hubertus Leonardus van den Boom
- G01 - MEASURING TESTING
Information Patent Application
Detector System for Transmission Electron Microscope
- Publication number 20120049061
- Publication date Mar 1, 2012
- FEI Company
- Uwe Luecken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detector System for Use with Transmission Electron Microscope Spect...
- Publication number 20120049060
- Publication date Mar 1, 2012
- FEI Company
- Uwe Luecken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CORRECTING DISTORTIONS IN A PARTICLE-OPTICAL APPARATUS
- Publication number 20100072366
- Publication date Mar 25, 2010
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OBTAINING A SCANNING TRANSMISSION IMAGE OF A SAMPLE IN A...
- Publication number 20090133167
- Publication date May 21, 2009
- FEI Company
- Alevtyna Yakushevska
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ATTACHING A SAMPLE TO A MANIPULATOR
- Publication number 20090000400
- Publication date Jan 1, 2009
- FEI Company
- Michael Frederick Hayles
- G02 - OPTICS

Uwe Luecken

Person

Patents Grantslast 30 patents

Method of investigating the wavefront of a charged-particle beam

Method of performing tomographic imaging of a sample in a charged-p...

Method for acquiring data with an image sensor

Method of measuring the temperature of a sample carrier in a charge...

Method of use for a multipole detector for a transmission electron...

Method of using a direct electron detector for a TEM

Distortion free stigmation of a TEM

Detector system for transmission electron microscope

Method for attaching a sample to a manipulator by melting and then...

Method for obtaining a scanning transmission image of a sample in a...

Patents Applicationslast 30 patents

METHOD OF INVESTIGATING THE WAVEFRONT OF A CHARGED-PARTICLE BEAM

METHOD OF PERFORMING TOMOGRAPHIC IMAGING OF A SAMPLE IN A CHARGED-P...

Method of Preparing a Biological Sample for Inspection with Electro...

METHOD FOR ACQUIRING DATA WITH AN IMAGE SENSOR

Distortion Free Stigmation of a TEM

Method of Measuring the Temperature of a Sample Carrier in a Charge...

Detector System for Transmission Electron Microscope

Detector System for Use with Transmission Electron Microscope Spect...

METHOD FOR CORRECTING DISTORTIONS IN A PARTICLE-OPTICAL APPARATUS

METHOD FOR OBTAINING A SCANNING TRANSMISSION IMAGE OF A SAMPLE IN A...

METHOD FOR ATTACHING A SAMPLE TO A MANIPULATOR