Uwe Schmalzbauer

Person

Hoehenkirchen-Siegertsbrunn, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device with polymer-based insulating material and met...
- Patent number 11,804,432
- Issue date Oct 31, 2023
- Infineon Technologies AG
- Markus Zundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing a semiconductor d...
- Patent number 9,570,433
- Issue date Feb 14, 2017
- Infineon Technologies AG
- Markus Zundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor component with integrated crack sensor and method for...
- Patent number 9,343,381
- Issue date May 17, 2016
- Infineon Technologies AG
- Markus Zundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device including a stress r...
- Patent number 9,218,960
- Issue date Dec 22, 2015
- Infineon Technologies AG
- Peter Nelle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for manufacturing a semiconductor d...
- Patent number 9,171,777
- Issue date Oct 27, 2015
- Infineon Technologies AG
- Markus Zundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafers and chips comprising test structures
- Patent number 8,933,448
- Issue date Jan 13, 2015
- Infineon Technologies AG
- Markus Zundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including a stress relief layer and method of...
- Patent number 8,803,297
- Issue date Aug 12, 2014
- Infineon Technologies AG
- Peter Nelle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Anchoring structure and intermeshing structure
- Patent number 8,084,865
- Issue date Dec 27, 2011
- Infineon Technologies AG
- Franz Hirler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing a semiconductor de...
- Patent number 7,939,885
- Issue date May 10, 2011
- Infineon Technologies Austria AG
- Mathias Hans-Ulrich Alexander Von Borcke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit including a semiconductor device
- Patent number 7,800,171
- Issue date Sep 21, 2010
- Infineon Technologies Austria AG
- Mathias Von Borcke
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE WITH POLYMER-BASED INSULATING MATERIAL AND MET...
- Publication number 20220254713
- Publication date Aug 11, 2022
- INFINEON TECHNOLOGIES AG
- Markus Zundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSISTOR COMPONENT HAVING GATE ELECTRODES AND FIELD ELECTRODES
- Publication number 20220052171
- Publication date Feb 17, 2022
- Felix Buth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Detecting a Crack in a Semiconductor Body of a Semicondu...
- Publication number 20160254200
- Publication date Sep 1, 2016
- INFINEON TECHNOLOGIES AG
- Markus Zundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING A SEMICONDUCTOR D...
- Publication number 20160013176
- Publication date Jan 14, 2016
- INFINEON TECHNOLOGIES AG
- Markus Zundel
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Component with Integrated Crack Sensor and Method for...
- Publication number 20140346509
- Publication date Nov 27, 2014
- Markus Zundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Manufacturing a Semiconductor Device Including a Stress R...
- Publication number 20140315391
- Publication date Oct 23, 2014
- Peter Nelle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING A SEMICONDUCTOR D...
- Publication number 20140167043
- Publication date Jun 19, 2014
- INFINEON TECHNOLOGIES AG
- Markus Zundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device and Method for Manufacturing a Semiconductor D...
- Publication number 20140167044
- Publication date Jun 19, 2014
- INFINEON TECHNOLOGIES AG
- Markus Zundel
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING A STRESS RELIEF LAYER AND METHOD OF...
- Publication number 20140042597
- Publication date Feb 13, 2014
- INFINEON TECHNOLOGIES AG
- Peter Nelle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafers and Chips Comprising Test Structures
- Publication number 20140027772
- Publication date Jan 30, 2014
- INFINEON TECHNOLOGIES AG
- Markus ZUNDEL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING A SEMICONDUCTOR DE...
- Publication number 20080296668
- Publication date Dec 4, 2008
- Infineon Technologies Austria AG
- Mathias Hans-Ulrich Alexander Von Borcke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Anchoring Structure and Intermeshing Structure
- Publication number 20080265427
- Publication date Oct 30, 2008
- Franz Hirler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT INCLUDING A SEMICONDUCTOR DEVICE
- Publication number 20080088355
- Publication date Apr 17, 2008
- Infineon Technologies Austria AG
- Mathias Von Borcke
- H03 - BASIC ELECTRONIC CIRCUITRY

Uwe Schmalzbauer

Person

Patents Grantslast 30 patents

Semiconductor device with polymer-based insulating material and met...

Semiconductor device and method for manufacturing a semiconductor d...

Semiconductor component with integrated crack sensor and method for...

Method of manufacturing a semiconductor device including a stress r...

Semiconductor device and method for manufacturing a semiconductor d...

Wafers and chips comprising test structures

Semiconductor device including a stress relief layer and method of...

Anchoring structure and intermeshing structure

Semiconductor device and method of manufacturing a semiconductor de...

Integrated circuit including a semiconductor device

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE WITH POLYMER-BASED INSULATING MATERIAL AND MET...

TRANSISTOR COMPONENT HAVING GATE ELECTRODES AND FIELD ELECTRODES

Method for Detecting a Crack in a Semiconductor Body of a Semicondu...

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING A SEMICONDUCTOR D...

Semiconductor Component with Integrated Crack Sensor and Method for...

Method of Manufacturing a Semiconductor Device Including a Stress R...

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING A SEMICONDUCTOR D...

Semiconductor Device and Method for Manufacturing a Semiconductor D...

SEMICONDUCTOR DEVICE INCLUDING A STRESS RELIEF LAYER AND METHOD OF...

Wafers and Chips Comprising Test Structures

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING A SEMICONDUCTOR DE...

Anchoring Structure and Intermeshing Structure

INTEGRATED CIRCUIT INCLUDING A SEMICONDUCTOR DEVICE