Vadim Kuchik

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Kiriat Ekron, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method for detecting voids and an inspection system
- Patent number 10,922,809
- Issue date Feb 16, 2021
- Applied Materials, Inc.
- Dror Shemesh
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING A DEPTH OF A HIDDEN STRUCTURAL ELEMENT BACKGROUND
- Publication number 20230317407
- Publication date Oct 5, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Lior Akerman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETECTING VOIDS AND AN INSPECTION SYSTEM
- Publication number 20190043183
- Publication date Feb 7, 2019
- Applied Materials, Inc.
- Dror Shemesh
- G06 - COMPUTING CALCULATING COUNTING