Vahe A. Adamian

Person

Lexington, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for calibrating a measurement device path and for...
- Patent number 7,157,918
- Issue date Jan 2, 2007
- Agilent Technologies, Inc.
- Vahe′ A. Adamian
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for calibrating a measurement device path and for...
- Patent number 7,019,535
- Issue date Mar 28, 2006
- Agilent Technologies, Inc.
- Vahe′ A. Adamian
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus, and article of manufacture for characterizing a...
- Patent number 6,937,032
- Issue date Aug 30, 2005
- Agilent Technologies, Inc.
- Vahe′ A. Adamian
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for calibrating a multiport test system for me...
- Patent number 6,920,407
- Issue date Jul 19, 2005
- Agilent Technologies, Inc.
- Vahe′ A. Adamian
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing multiport through-reflect-line...
- Patent number 6,853,198
- Issue date Feb 8, 2005
- Agilent Technologies, Inc.
- Ali Boudiaf
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for calibrating a multiport test system for me...
- Patent number 6,826,506
- Issue date Nov 30, 2004
- Agilent Technologies, Inc.
- Vahe′ A. Adamian
- G01 - MEASURING TESTING
Information Patent Grant
Method, apparatus, and article of manufacture for predicting electr...
- Patent number 6,757,625
- Issue date Jun 29, 2004
- Agilent Technologies, Inc.
- Vahe′ A. Adamian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, apparatus, and article of manufacture for characterizing a...
- Patent number 6,744,262
- Issue date Jun 1, 2004
- Agilent Technologies, Inc.
- Vahe' A. Adamian
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for linear characterization of multi-terminal...
- Patent number 6,653,848
- Issue date Nov 25, 2003
- Agilent Technologies, Inc.
- Vahe Adamian
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for providing and calibrating a multiport netw...
- Patent number 5,578,932
- Issue date Nov 26, 1996
- ATN Microwave, Inc.
- Vahe A. Adamian
- G01 - MEASURING TESTING
Information Patent Grant
Electronic calibration method and apparatus
- Patent number 5,552,714
- Issue date Sep 3, 1996
- ATN Microwave, Inc.
- Vahe A. Adamian
- G01 - MEASURING TESTING
Information Patent Grant
Electronic calibration method and apparatus
- Patent number 5,548,221
- Issue date Aug 20, 1996
- ATN Microwave, Inc.
- Vahe A. Adamian
- G01 - MEASURING TESTING
Information Patent Grant
Electronic calibration method and apparatus
- Patent number 5,537,046
- Issue date Jul 16, 1996
- ATN Microwave, Inc.
- Vahe A. Adamian
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method and apparatus
- Patent number 5,467,021
- Issue date Nov 14, 1995
- ATN Microwave, Inc.
- Vahe A. Adamian
- G01 - MEASURING TESTING
Information Patent Grant
Electronic microwave calibration device
- Patent number 5,434,511
- Issue date Jul 18, 1995
- ATN Microwave, Inc.
- Vahe A. Adamian
- G01 - MEASURING TESTING
Information Patent Grant
Programmable broadband electronic tuner
- Patent number 5,034,708
- Issue date Jul 23, 1991
- Automatic Testing and Networking, Inc.
- Vahe' A. Adamian
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and system for calibrating a measurement device path and for...
- Publication number 20060181286
- Publication date Aug 17, 2006
- Agilent Technologies Inc.
- Vahe A. Adamian
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for calibrating a multiport test system for me...
- Publication number 20040193382
- Publication date Sep 30, 2004
- Vahe' A. Adamian
- G01 - MEASURING TESTING
Information Patent Application
Method, apparatus, and article of manufacture for characterizing a...
- Publication number 20040160230
- Publication date Aug 19, 2004
- Vahe A. Adamian
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for performing multiport through-reflect-line...
- Publication number 20040095145
- Publication date May 20, 2004
- Ali Boudiaf
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for linear characterization of multi-terminal...
- Publication number 20020053899
- Publication date May 9, 2002
- Vahe Adamian
- G01 - MEASURING TESTING

Vahe A. Adamian

Person

Patents Grantslast 30 patents

Method and system for calibrating a measurement device path and for...

Method and system for calibrating a measurement device path and for...

Method, apparatus, and article of manufacture for characterizing a...

Method and apparatus for calibrating a multiport test system for me...

Method and apparatus for performing multiport through-reflect-line...

Method and apparatus for calibrating a multiport test system for me...

Method, apparatus, and article of manufacture for predicting electr...

Method, apparatus, and article of manufacture for characterizing a...

Method and apparatus for linear characterization of multi-terminal...

Method and apparatus for providing and calibrating a multiport netw...

Electronic calibration method and apparatus

Electronic calibration method and apparatus

Electronic calibration method and apparatus

Calibration method and apparatus

Electronic microwave calibration device

Programmable broadband electronic tuner

Patents Applicationslast 30 patents

Method and system for calibrating a measurement device path and for...

Method and apparatus for calibrating a multiport test system for me...

Method, apparatus, and article of manufacture for characterizing a...

Method and apparatus for performing multiport through-reflect-line...

Method and apparatus for linear characterization of multi-terminal...