Vaibhav Gaind

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Multimode defect classification in semiconductor inspection
- Patent number 11,668,655
- Issue date Jun 6, 2023
- KLA Corporation
- Vaibhav Gaind
- G01 - MEASURING TESTING
Information Patent Grant
Multi-imaging mode image alignment
- Patent number 11,580,650
- Issue date Feb 14, 2023
- KLA Corp.
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Statistical learning-based mode selection for multi-mode inspection
- Patent number 11,415,531
- Issue date Aug 16, 2022
- KLA Corp.
- Vaibhav Gaind
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for locating discontinuities in tissue using optical imagin...
- Patent number 11,116,445
- Issue date Sep 14, 2021
- Purdue Research Foundation
- Brian Zahler Bentz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for speckle suppression in laser dark-field s...
- Patent number 10,067,072
- Issue date Sep 4, 2018
- KLA-Tencor Corporation
- Vaibhav Gaind
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Pattern suppression in logic for wafer inspection
- Patent number 9,506,873
- Issue date Nov 29, 2016
- KLA-Tencor Corp.
- Vaibhav Gaind
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
STATISTICAL LEARNING-BASED MODE SELECTION FOR MULTI-MODE INSPECTION
- Publication number 20210109041
- Publication date Apr 15, 2021
- KLA Corporation
- Vaibhav Gaind
- G01 - MEASURING TESTING
Information Patent Application
MULTI-IMAGING MODE IMAGE ALIGNMENT
- Publication number 20210097704
- Publication date Apr 1, 2021
- KLA Corporation
- Bjorn Brauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multimode Defect Classification in Semiconductor Inspection
- Publication number 20200025689
- Publication date Jan 23, 2020
- KLA-Tencor Corporation
- Vaibhav Gaind
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR LOCATING DISCONTINUITIES IN TISSUE USING OPTICAL IMAGIN...
- Publication number 20180325449
- Publication date Nov 15, 2018
- PURDUE RESEARCH FOUNDATION
- Brian Zahler Bentz
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHODS AND APPARATUS FOR SPECKLE SUPPRESSION IN LASER DARK-FIELD S...
- Publication number 20170011495
- Publication date Jan 12, 2017
- KLA-Tencor Corporation
- Vaibhav Gaind
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Suppression in Logic for Wafer Inspection
- Publication number 20150293035
- Publication date Oct 15, 2015
- KLA-Tencor Corporation
- Vaibhav Gaind
- G01 - MEASURING TESTING