Valerie A. Liudzius

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Chatsworth, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device inspection system
- Patent number 4,872,052
- Issue date Oct 3, 1989
- View Engineering, Inc.
- Valerie A. Liudzius
- G01 - MEASURING TESTING
Information Patent Grant
High speed pattern recognizer
- Patent number 4,736,437
- Issue date Apr 5, 1988
- View Engineering, Inc.
- Jack Sacks
- G06 - COMPUTING CALCULATING COUNTING