Valerie Brogden

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for performing sample lift-out for highly react...
- Patent number 12,165,832
- Issue date Dec 10, 2024
- FEI Company
- Adam Stokes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated TEM sample preparation
- Patent number 10,825,651
- Issue date Nov 3, 2020
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Grant
Automated TEM sample preparation
- Patent number 10,340,119
- Issue date Jul 2, 2019
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Grant
Automated TEM sample preparation
- Patent number 9,601,313
- Issue date Mar 21, 2017
- FEI Company
- Valerie Brogden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High capacity TEM grid
- Patent number 9,281,163
- Issue date Mar 8, 2016
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for slice and view sample imaging
- Patent number 9,218,940
- Issue date Dec 22, 2015
- FEI Company
- Valerie Brogden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for slice and view sample imaging
- Patent number 9,190,244
- Issue date Nov 17, 2015
- FEI Company
- Valerie Brogden
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR PERFORMING SAMPLE LIFT-OUT FOR HIGHLY REACT...
- Publication number 20230215683
- Publication date Jul 6, 2023
- FEI Company
- Adam STOKES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED TEM SAMPLE PREPARATION
- Publication number 20190272975
- Publication date Sep 5, 2019
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEM SAMPLE PREPARATION
- Publication number 20170256380
- Publication date Sep 7, 2017
- FEI Company
- Valerie Brogden
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED TEM SAMPLE PREPARATION
- Publication number 20160141147
- Publication date May 19, 2016
- FEI Company
- Valerie Brogden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR SLICE AND VIEW SAMPLE IMAGING
- Publication number 20150348751
- Publication date Dec 3, 2015
- FEI Company
- Valerie Brogden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High Capacity TEM Grid
- Publication number 20150294834
- Publication date Oct 15, 2015
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING