Valts Edgars Treibergs

Person

South Bend, IN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Compliant ground block and testing system for testing integrated ci...
- Patent number D1044751
- Issue date Oct 1, 2024
- Johnstech International Corporation
- Valts Treibergs
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Contact assembly array and testing system having contact assembly a...
- Patent number 11,906,576
- Issue date Feb 20, 2024
- Johnstech International Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Contact assembly and kelvin testing system having contact assembly
- Patent number 11,867,752
- Issue date Jan 9, 2024
- Johnstech International Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Compliant ground block and testing system having compliant ground b...
- Patent number 11,821,943
- Issue date Nov 21, 2023
- Johnstech International Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Spring-loaded probe having folded portions and probe assembly
- Patent number 11,268,981
- Issue date Mar 8, 2022
- Xcerra Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Test socket assembly and related methods
- Patent number 11,088,051
- Issue date Aug 10, 2021
- Xcerra Corporation
- Valts Treibergs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid probe head assembly for testing a wafer device under test
- Patent number 11,041,881
- Issue date Jun 22, 2021
- Xcerra Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Link socket sliding mount with preload
- Patent number 10,101,360
- Issue date Oct 16, 2018
- Xcerra Corporation
- Aaron Magnuson
- G01 - MEASURING TESTING
Information Patent Grant
Test socket assembly and related methods
- Patent number 10,037,933
- Issue date Jul 31, 2018
- Xcerra Corporation
- Valts Treibergs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test socket assembly and related methods
- Patent number 9,875,954
- Issue date Jan 23, 2018
- Xcerra Corporation
- Valts Treibergs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test probe assembly and related methods
- Patent number 9,829,506
- Issue date Nov 28, 2017
- Xcerra Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact assembly
- Patent number 8,523,579
- Issue date Sep 3, 2013
- Delaware Capital Formation, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact assembly
- Patent number 8,231,416
- Issue date Jul 31, 2012
- Delaware Capital Formation, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact assembly
- Patent number 7,862,391
- Issue date Jan 4, 2011
- Delaware Capital Formation, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Grant
Electrical contact probe with compliant internal interconnect
- Patent number 7,256,593
- Issue date Aug 14, 2007
- Delaware Capital Formation, Inc.
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Integrated printed circuit board and test contactor for high speed...
- Patent number 7,173,442
- Issue date Feb 6, 2007
- Delaware Capital Formation, Inc.
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit test socket having torsion wire contacts
- Patent number 6,217,341
- Issue date Apr 17, 2001
- Wells-CTi, Inc.
- Michael Glick
- G01 - MEASURING TESTING
Information Patent Grant
Socket for positioning and installing an integrated circuit on a ci...
- Patent number 6,162,080
- Issue date Dec 19, 2000
- Wells-CTI
- Valts E. Treibergs
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Test socket for electronic module
- Patent number 6,045,370
- Issue date Apr 4, 2000
- Wells-CTi, Inc.
- Valts Edgars Treibergs
- G01 - MEASURING TESTING
Information Patent Grant
Test contactor
- Patent number 5,990,693
- Issue date Nov 23, 1999
- Wells-CTI
- William John Hayes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPRING PROBE CONTACT ASSEMBLY
- Publication number 20240241153
- Publication date Jul 18, 2024
- Johnstech International Corporation
- Valts Treibergs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPRING PROBE ASSEMBLY FOR A KELVIN TESTING SYSTEM
- Publication number 20230258688
- Publication date Aug 17, 2023
- Johnstech International Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Application
COMPLIANT GROUND BLOCK AND TESTING SYSTEM HAVING COMPLIANT GROUND B...
- Publication number 20220107359
- Publication date Apr 7, 2022
- Johnstech International Corporation
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Application
SPRING-LOADED PROBE HAVING FOLDED PORTIONS AND PROBE ASSEMBLY
- Publication number 20200064373
- Publication date Feb 27, 2020
- XCERRA CORPORATION
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Application
HYBRID PROBE HEAD ASSEMBLY FOR TESTING A WAFER DEVICE UNDER TEST
- Publication number 20190369142
- Publication date Dec 5, 2019
- XCERRA CORPORATION
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Application
LINK SOCKET SLIDING MOUNT WITH PRELOAD
- Publication number 20180120348
- Publication date May 3, 2018
- XCERRA CORPORATION
- Aaron Magnuson
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET ASSEMBLY AND RELATED METHODS
- Publication number 20180096917
- Publication date Apr 5, 2018
- XCERRA CORPORATION
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Application
TEST SOCKET ASSEMBLY AND RELATED METHODS
- Publication number 20150369840
- Publication date Dec 24, 2015
- XCERRA CORPORATION
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Application
TEST PROBE ASSEMBLY AND RELATED METHODS
- Publication number 20150070040
- Publication date Mar 12, 2015
- XCERRA CORPORATION
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Application
SPRING CONTACT ASSEMBLY
- Publication number 20120282821
- Publication date Nov 8, 2012
- Delaware Capital Formation, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Application
SPRING CONTACT ASSEMBLY
- Publication number 20110039457
- Publication date Feb 17, 2011
- Delaware Capital Formation, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Application
SPRING CONTACT ASSEMBLY
- Publication number 20090075529
- Publication date Mar 19, 2009
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Application
Electrical contact probe with compliant internal interconnect
- Publication number 20060279301
- Publication date Dec 14, 2006
- Valts Treibergs
- G01 - MEASURING TESTING
Information Patent Application
Integrated printed circuit board and test contactor for high speed...
- Publication number 20050046433
- Publication date Mar 3, 2005
- Valts Treibergs
- G01 - MEASURING TESTING

Valts Edgars Treibergs

Person

Patents Grantslast 30 patents

Compliant ground block and testing system for testing integrated ci...

Contact assembly array and testing system having contact assembly a...

Contact assembly and kelvin testing system having contact assembly

Compliant ground block and testing system having compliant ground b...

Spring-loaded probe having folded portions and probe assembly

Test socket assembly and related methods

Hybrid probe head assembly for testing a wafer device under test

Link socket sliding mount with preload

Test socket assembly and related methods

Test socket assembly and related methods

Test probe assembly and related methods

Spring contact assembly

Spring contact assembly

Spring contact assembly

Electrical contact probe with compliant internal interconnect

Integrated printed circuit board and test contactor for high speed...

Integrated circuit test socket having torsion wire contacts

Socket for positioning and installing an integrated circuit on a ci...

Test socket for electronic module

Test contactor

Patents Applicationslast 30 patents

SPRING PROBE CONTACT ASSEMBLY

SPRING PROBE ASSEMBLY FOR A KELVIN TESTING SYSTEM

COMPLIANT GROUND BLOCK AND TESTING SYSTEM HAVING COMPLIANT GROUND B...

SPRING-LOADED PROBE HAVING FOLDED PORTIONS AND PROBE ASSEMBLY

HYBRID PROBE HEAD ASSEMBLY FOR TESTING A WAFER DEVICE UNDER TEST

LINK SOCKET SLIDING MOUNT WITH PRELOAD

TEST SOCKET ASSEMBLY AND RELATED METHODS

TEST SOCKET ASSEMBLY AND RELATED METHODS

TEST PROBE ASSEMBLY AND RELATED METHODS

SPRING CONTACT ASSEMBLY

SPRING CONTACT ASSEMBLY

SPRING CONTACT ASSEMBLY

Electrical contact probe with compliant internal interconnect

Integrated printed circuit board and test contactor for high speed...