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Vamsi Velidandla
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Multi-surface optical 3D microscope
Patent number
9,664,888
Issue date
May 30, 2017
Zeta Instruments, Inc.
Ken Kinsun Lee
G02 - OPTICS
Information
Patent Grant
Multi-surface optical 3D microscope
Patent number
9,645,381
Issue date
May 9, 2017
Zeta Instruments, Inc.
Ken Kinsun Lee
G02 - OPTICS
Information
Patent Grant
Multi-surface optical 3D microscope
Patent number
9,036,869
Issue date
May 19, 2015
Zeta Instruments, Inc.
Ken Kinsun Lee
G02 - OPTICS
Information
Patent Grant
Surface finish roughness measurement
Patent number
7,630,086
Issue date
Dec 8, 2009
KLA-Tencor Corporation
Dave S. Oak
G01 - MEASURING TESTING
Information
Patent Grant
Wafer edge inspection
Patent number
7,532,318
Issue date
May 12, 2009
KLA-Tencor Corporation
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Grant
System and method for optimizing wafer flatness at high rotational...
Patent number
7,396,022
Issue date
Jul 8, 2008
KLA-Tencor Technologies Corp.
Alireza Shahdoost Moghadam
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Servo pattern characterization on magnetic disks
Patent number
7,397,621
Issue date
Jul 8, 2008
KLA-Tencor Technologies Corporation
Zhen Hou
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for detecting an end-point for polishing a material
Patent number
7,355,711
Issue date
Apr 8, 2008
KLA-Tencor Technologies Corporation
Vamsi Mohan Velidandla
G01 - MEASURING TESTING
Information
Patent Grant
Detecting surface pits
Patent number
7,295,300
Issue date
Nov 13, 2007
KLA-Tencor Technologies Corporation
Laurie Bechtler
G01 - MEASURING TESTING
Information
Patent Grant
Wafer edge inspection
Patent number
7,161,669
Issue date
Jan 9, 2007
KLA-Tencor Technologies Corporation
Vamsi Velidandla
G01 - MEASURING TESTING
Information
Patent Grant
System and method for automatically determining magnetic eccentrici...
Patent number
7,075,741
Issue date
Jul 11, 2006
KLA Tencor Technologues Corporation
Ronny Soetarman
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
Multi-Surface Optical 3D Microscope
Publication number
20150226952
Publication date
Aug 13, 2015
Zeta Instruments, Inc.
Ken Kinsun Lee
G02 - OPTICS
Information
Patent Application
Multi-Surface Optical 3D Microscope
Publication number
20150226953
Publication date
Aug 13, 2015
Zeta Instruments, Inc.
Ken Kinsun Lee
G02 - OPTICS
Information
Patent Application
WAFER EDGE INSPECTION
Publication number
20070127016
Publication date
Jun 7, 2007
Steven W. Meeks
G01 - MEASURING TESTING
Information
Patent Application
SURFACE FINISH ROUGHNESS MEASUREMENT
Publication number
20070115483
Publication date
May 24, 2007
Dave S. Oak
G01 - MEASURING TESTING
Information
Patent Application
Method for detecting an end-point for polishing a material
Publication number
20070004061
Publication date
Jan 4, 2007
Vamsi Mohan Velidandla
G01 - MEASURING TESTING
Information
Patent Application
Wafer edge inspection
Publication number
20060250611
Publication date
Nov 9, 2006
KLA-Tencor Technologies Corp.
Vamsi Velidandla
G01 - MEASURING TESTING
Information
Patent Application
Servo pattern characterization on magnetic disks
Publication number
20060215289
Publication date
Sep 28, 2006
KLA-Tencor Technologies Corp.
Zhen Hou
G11 - INFORMATION STORAGE