Van-Hung Pham

Person

Milpitas, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for non-destructive determination of dielectric b...
- Patent number 8,501,504
- Issue date Aug 6, 2013
- Advanced Micro Devices, Inc.
- Kok Yong Yiang
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric breakdown lifetime enhancement using alternating current...
- Patent number 8,022,716
- Issue date Sep 20, 2011
- GLOBALFOUNDRIES Inc.
- Kok Yong Yiang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for Joule heating characterization
- Patent number 6,770,847
- Issue date Aug 3, 2004
- Advanced Micro Devices, Inc.
- Huade W. Yao
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reliability testing of integrated circuit...
- Patent number 6,329,831
- Issue date Dec 11, 2001
- Advanced Micro Devices, Inc.
- Nguyen Duc Bui
- G01 - MEASURING TESTING
Information Patent Grant
Sensitive technique for metal-void detection
- Patent number 6,100,101
- Issue date Aug 8, 2000
- Advanced Micro Devices Inc.
- Amit P. Marathe
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having a multi-layer metal interconnect structure
- Patent number 6,075,293
- Issue date Jun 13, 2000
- Advanced Micro Devices, Inc.
- Xiao-Yu Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating the effect of a barrier layer on electromigra...
- Patent number 5,786,705
- Issue date Jul 28, 1998
- Advanced Micro Devices, Inc.
- Nguyen Duc Bui
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating the effect of a barrier layer on electromigra...
- Patent number 5,612,627
- Issue date Mar 18, 1997
- Advanced Micro Devices, Inc.
- Nguyen D. Bui
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DIELECTRIC BREAKDOWN LIFETIME ENHANCEMENT USING ALTERNATING CURRENT...
- Publication number 20110018565
- Publication date Jan 27, 2011
- GLOBAL FOUNDRIES Inc.
- Kok Yong Yiang
- G01 - MEASURING TESTING
Information Patent Application
Method and system for non-destructive determination of dielectric b...
- Publication number 20100117676
- Publication date May 13, 2010
- Advanced Micro Devices, Inc.
- Kok Yong Yiang
- G01 - MEASURING TESTING
Information Patent Application
Method and system for joule heating characterization
- Publication number 20040060916
- Publication date Apr 1, 2004
- Advanced Micro Devices, Inc.
- Huade W. Yao
- G01 - MEASURING TESTING

Van-Hung Pham

Person

Patents Grantslast 30 patents

Method and system for non-destructive determination of dielectric b...

Dielectric breakdown lifetime enhancement using alternating current...

Method and system for Joule heating characterization

Method and apparatus for reliability testing of integrated circuit...

Sensitive technique for metal-void detection

Semiconductor device having a multi-layer metal interconnect structure

Method for evaluating the effect of a barrier layer on electromigra...

Method for evaluating the effect of a barrier layer on electromigra...

Patents Applicationslast 30 patents

DIELECTRIC BREAKDOWN LIFETIME ENHANCEMENT USING ALTERNATING CURRENT...

Method and system for non-destructive determination of dielectric b...

Method and system for joule heating characterization