Vance R. Harwood

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Loveland, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit transfer test device system utilizing lateral tr...
- Patent number 5,101,152
- Issue date Mar 31, 1992
- Hewlett-Packard Company
- Vance R. Harwood
- G01 - MEASURING TESTING
Information Patent Grant
Modular/concurrent board tester
- Patent number 5,032,789
- Issue date Jul 16, 1991
- Hewlett-Packard Company
- Kamran Firooz
- G01 - MEASURING TESTING
Information Patent Grant
Circuits and apparatus which enable elimination of setup time and h...
- Patent number 4,799,023
- Issue date Jan 17, 1989
- Hewlett-Packard Company
- Kamran Firooz
- G01 - MEASURING TESTING
Information Patent Grant
High throughput circuit tester and test technique avoiding overdriv...
- Patent number 4,588,945
- Issue date May 13, 1986
- Hewlett-Packard Company
- William A. Groves
- G01 - MEASURING TESTING