Vandana Sapra

Person

  • Delhi, IN

Patents Grantslast 30 patents

  • Information Patent Grant

    Glitch detector

    • Patent number 11,609,600
    • Issue date Mar 21, 2023
    • NXP USA, INC.
    • Rohit Kumar Sinha
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Glitch detector

    • Patent number 11,429,142
    • Issue date Aug 30, 2022
    • NXP USA, INC.
    • Rohit Kumar Sinha
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Fixed-width pulse generator

    • Patent number 10,911,035
    • Issue date Feb 2, 2021
    • NXP USA, INC.
    • Rohit Kumar Sinha
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Secure clock switch circuit

    • Patent number 9,891,654
    • Issue date Feb 13, 2018
    • NXP USA, INC.
    • Rohit K. Sinha
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    System for testing integrated circuit

    • Patent number 9,645,195
    • Issue date May 9, 2017
    • FREESCALE SEMICONDUCTOR, INC.
    • Kumar Abhishek
    • H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

  • Information Patent Application

    GLITCH DETECTOR

    • Publication number 20220382322
    • Publication date Dec 1, 2022
    • NXP USA, Inc.
    • Rohit Kumar Sinha
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    GLITCH DETECTOR

    • Publication number 20220197332
    • Publication date Jun 23, 2022
    • NXP USA, Inc.
    • Rohit Kumar Sinha
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    SECURE CLOCK SWITCH CIRCUIT

    • Publication number 20170227982
    • Publication date Aug 10, 2017
    • FREESCALE SEMICONDUCTOR, INC.
    • ROHIT K. SINHA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    SYSTEM FOR TESTING INTEGRATED CIRCUIT

    • Publication number 20150346272
    • Publication date Dec 3, 2015
    • FREESCALE SEMICONDUCTOR, INC.
    • Kumar Abhishek
    • G01 - MEASURING TESTING