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Vanessa Brunkhorst
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Colchester, VT, US
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last 30 patents
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Patent Grant
Method for optimizing a set of scan diagnostic patterns
Patent number
6,996,791
Issue date
Feb 7, 2006
International Business Machines Corporation
Vanessa Brunkhorst
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
METHOD FOR OPTIMIZING A SET OF SCAN DIAGNOSTIC PATTERNS
Publication number
20050114747
Publication date
May 26, 2005
International Business Machines Corporation
Vanessa Brunkhorst
G01 - MEASURING TESTING