Varoujan Chakarian

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Low open area and coupon endpoint detection
- Patent number 12,080,574
- Issue date Sep 3, 2024
- Applied Materials, Inc.
- Varoujan Chakarian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Concentration sensor for precursor delivery system
- Patent number 11,808,746
- Issue date Nov 7, 2023
- Applied Materials, Inc.
- Vivek B. Shah
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Systems and methods for acquiring information about a defect on a s...
- Patent number 8,045,145
- Issue date Oct 25, 2011
- KLA-Tencor Technologies Corp.
- Dave Bakker
- G01 - MEASURING TESTING
Information Patent Grant
Automated focusing of electron image
- Patent number 7,247,849
- Issue date Jul 24, 2007
- KLA-Tencor Technologies Corporation
- Gabor D. Toth
- G01 - MEASURING TESTING
Information Patent Grant
Automated focusing of electron image
- Patent number 7,041,976
- Issue date May 9, 2006
- KLA-Tencor Technologies Corporation
- Mark A. Neil
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR IMAGE-BASED SENSOR TRACE ANALYSIS
- Publication number 20250061557
- Publication date Feb 20, 2025
- Applied Materials, Inc.
- Varoujan Chakarian
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOW OPEN AREA AND COUPON ENDPOINT DETECTION
- Publication number 20240429077
- Publication date Dec 26, 2024
- Applied Materials, Inc.
- Varoujan Chakarian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW OPEN AREA AND COUPON ENDPOINT DETECTION
- Publication number 20240420975
- Publication date Dec 19, 2024
- Applied Materials, Inc.
- Varoujan Chakarian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS CHARACTERIZATION AND CORRECTION USING OPTICAL WALL PROCESS...
- Publication number 20230295799
- Publication date Sep 21, 2023
- Applied Materials, Inc.
- Jeffrey Yat Shan Au
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PROCESS CHARACTERIZATION AND CORRECTION USING OPTICAL WALL PROCESS...
- Publication number 20230298872
- Publication date Sep 21, 2023
- Applied Materials, Inc.
- Jeffrey Yat Shan Au
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONCENTRATION SENSOR FOR PRECURSOR DELIVERY SYSTEM
- Publication number 20230003704
- Publication date Jan 5, 2023
- Applied Materials, Inc.
- Vivek B. Shah
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHODS AND APPARATUS FOR IN-SITU DEPOSITION MONITORING
- Publication number 20220081758
- Publication date Mar 17, 2022
- Applied Materials, Inc.
- Xiaodong WANG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
LOW OPEN AREA AND COUPON ENDPOINT DETECTION
- Publication number 20220020617
- Publication date Jan 20, 2022
- Applied Materials, Inc.
- Varoujan Chakarian
- G01 - MEASURING TESTING

Varoujan Chakarian

Person

Patents Grantslast 30 patents

Low open area and coupon endpoint detection

Concentration sensor for precursor delivery system

Systems and methods for acquiring information about a defect on a s...

Automated focusing of electron image

Automated focusing of electron image

Patents Applicationslast 30 patents

METHOD FOR IMAGE-BASED SENSOR TRACE ANALYSIS

LOW OPEN AREA AND COUPON ENDPOINT DETECTION

LOW OPEN AREA AND COUPON ENDPOINT DETECTION

PROCESS CHARACTERIZATION AND CORRECTION USING OPTICAL WALL PROCESS...

PROCESS CHARACTERIZATION AND CORRECTION USING OPTICAL WALL PROCESS...

CONCENTRATION SENSOR FOR PRECURSOR DELIVERY SYSTEM

METHODS AND APPARATUS FOR IN-SITU DEPOSITION MONITORING

LOW OPEN AREA AND COUPON ENDPOINT DETECTION