Vasco Tomas Tenner

Person

Amsterdam, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Metrology apparatus and method for determining a characteristic of...
- Patent number 12,066,764
- Issue date Aug 20, 2024
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system and method for determining a characteristic of one...
- Patent number 12,007,700
- Issue date Jun 11, 2024
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G01 - MEASURING TESTING
Information Patent Grant
Metrology apparatus and method for determining a characteristic of...
- Patent number 11,709,436
- Issue date Jul 25, 2023
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G01 - MEASURING TESTING
Information Patent Grant
Metrology apparatus and method for determining a characteristic of...
- Patent number 11,650,047
- Issue date May 16, 2023
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology system and method for determining a characteristic of one...
- Patent number 11,415,900
- Issue date Aug 16, 2022
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology apparatus and method for determining a characteristic of...
- Patent number 11,125,806
- Issue date Sep 21, 2021
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining a characteristic of a structure, and metrolog...
- Patent number 11,119,415
- Issue date Sep 14, 2021
- ASML Netherlands B.V.
- Johannes Fitzgerald De Boer
- G01 - MEASURING TESTING
Information Patent Grant
Metrology apparatus and method for determining a characteristic of...
- Patent number 11,009,343
- Issue date May 18, 2021
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G01 - MEASURING TESTING
Information Patent Grant
Metrology system and method for determining a characteristic of one...
- Patent number 10,816,909
- Issue date Oct 27, 2020
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY METHOD AND METHOD FOR TRAINING A DATA STRUCTURE FOR USE I...
- Publication number 20250014164
- Publication date Jan 9, 2025
- ASML NETHERLANDS B.V.
- Vasco Tomas TENNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY METHOD AND METROLOGY DEVICE
- Publication number 20240345489
- Publication date Oct 17, 2024
- ASML NETHERLANDS B.V.
- Vasco Tomas TENNER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METROLOGY SYSTEM AND METHOD FOR DETERMINING A CHARACTERISTIC OF ONE...
- Publication number 20240319620
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Patricius Aloysius Jacobus TINNEMANS
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL HOLOGRAPHIC MICROSCOPE AND ASSOCIATED METROLOGY METHOD
- Publication number 20240160151
- Publication date May 16, 2024
- ASML NETHERLANDS B.V.
- Willem Marie Julia Marcel COENE
- G02 - OPTICS
Information Patent Application
DARK FIELD DIGITAL HOLOGRAPHIC MICROSCOPE AND ASSOCIATED METROLOGY...
- Publication number 20230341813
- Publication date Oct 26, 2023
- ASML NETHERLANDS B.V.
- Nitesh PANDEY
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METROLOGY APPARATUS AND METHOD FOR DETERMINING A CHARACTERISTIC OF...
- Publication number 20230273255
- Publication date Aug 31, 2023
- ASML NETHERLANDS B.V.
- Patricius Aloysius Jacobus TINNEMANS
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY METHOD AND DEVICE FOR MEASURING A PERIODIC STRUCTURE ON A...
- Publication number 20230064193
- Publication date Mar 2, 2023
- ASML NETHERLANDS B.V.
- Patricius Aloysius Jacobus TINNEMANS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Metrology System and Method for Determining a Characteristic of One...
- Publication number 20230062585
- Publication date Mar 2, 2023
- ASML NETHERLANDS B.V.
- Patricius Aloysius Jacobus TINNEMANS
- G01 - MEASURING TESTING
Information Patent Application
DARK FIELD DIGITAL HOLOGRAPHIC MICROSCOPE AND ASSOCIATED METROLOGY...
- Publication number 20230044632
- Publication date Feb 9, 2023
- ASML NETHERLANDS B.V.
- Willem Marie Julia Marcel COENE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
A METHOD FOR FILTERING AN IMAGE AND ASSOCIATED METROLOGY APPARATUS
- Publication number 20220350260
- Publication date Nov 3, 2022
- ASML Holding N.V.
- Armand Eugene Albert
- G01 - MEASURING TESTING
Information Patent Application
Metrology Method and Method for Training a Data Structure for Use i...
- Publication number 20220309645
- Publication date Sep 29, 2022
- ASML NETHERLANDS B.V.
- Vasco Tomas TENNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY APPARATUS AND METHOD FOR DETERMINING A CHARACTERISTIC OF...
- Publication number 20210389365
- Publication date Dec 16, 2021
- ASML NETHERLANDS B.V.
- Patricius Aloysius Jacobus TINNEMANS
- G01 - MEASURING TESTING
Information Patent Application
Method of Determining a Characteristic of a Structure, and Metrolog...
- Publication number 20210349403
- Publication date Nov 11, 2021
- ASML NETHERLANDS B.V.
- Johannes Fitzgerald De Boer
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY APPARATUS AND METHOD FOR DETERMINING A CHARACTERISTIC OF...
- Publication number 20210325174
- Publication date Oct 21, 2021
- ASML NETHERLANDS B.V.
- Patricius Aloysius Jacobus TINNEMANS
- G01 - MEASURING TESTING
Information Patent Application
Metrology System and Method For Determining a Characteristic of one...
- Publication number 20210003924
- Publication date Jan 7, 2021
- ASML NETHERLANDS B.V.
- Patricius Aloysius Jacobus TINNEMANS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Apparatus and Method for Determining a Characteristic of...
- Publication number 20200041563
- Publication date Feb 6, 2020
- Stichting VU
- Patricius Aloysius Jacobus TINNEMANS
- G01 - MEASURING TESTING
Information Patent Application
Method of Determining a Characteristic of a Structure, and Metrolog...
- Publication number 20190310559
- Publication date Oct 10, 2019
- Stichting VU
- Johannes Fitzgerald DE BOER
- G01 - MEASURING TESTING
Information Patent Application
Metrology Apparatus and Method for Determining a Characteristic of...
- Publication number 20190265028
- Publication date Aug 29, 2019
- Stichting VU
- Patricius Aloysius Jacobus TINNEMANS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology System and Method For Determining a Characteristic of One...
- Publication number 20190107781
- Publication date Apr 11, 2019
- Stichting VU
- Patricius Aloysius Jacobus TINNEMANS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Vasco Tomas Tenner

Person

Patents Grantslast 30 patents

Metrology apparatus and method for determining a characteristic of...

Metrology system and method for determining a characteristic of one...

Metrology apparatus and method for determining a characteristic of...

Metrology apparatus and method for determining a characteristic of...

Metrology system and method for determining a characteristic of one...

Metrology apparatus and method for determining a characteristic of...

Method of determining a characteristic of a structure, and metrolog...

Metrology apparatus and method for determining a characteristic of...

Metrology system and method for determining a characteristic of one...

Patents Applicationslast 30 patents

METROLOGY METHOD AND METHOD FOR TRAINING A DATA STRUCTURE FOR USE I...

METROLOGY METHOD AND METROLOGY DEVICE

METROLOGY SYSTEM AND METHOD FOR DETERMINING A CHARACTERISTIC OF ONE...

DIGITAL HOLOGRAPHIC MICROSCOPE AND ASSOCIATED METROLOGY METHOD

DARK FIELD DIGITAL HOLOGRAPHIC MICROSCOPE AND ASSOCIATED METROLOGY...

METROLOGY APPARATUS AND METHOD FOR DETERMINING A CHARACTERISTIC OF...

METROLOGY METHOD AND DEVICE FOR MEASURING A PERIODIC STRUCTURE ON A...

Metrology System and Method for Determining a Characteristic of One...

DARK FIELD DIGITAL HOLOGRAPHIC MICROSCOPE AND ASSOCIATED METROLOGY...

A METHOD FOR FILTERING AN IMAGE AND ASSOCIATED METROLOGY APPARATUS

Metrology Method and Method for Training a Data Structure for Use i...

METROLOGY APPARATUS AND METHOD FOR DETERMINING A CHARACTERISTIC OF...

Method of Determining a Characteristic of a Structure, and Metrolog...

METROLOGY APPARATUS AND METHOD FOR DETERMINING A CHARACTERISTIC OF...

Metrology System and Method For Determining a Characteristic of one...

Metrology Apparatus and Method for Determining a Characteristic of...

Method of Determining a Characteristic of a Structure, and Metrolog...

Metrology Apparatus and Method for Determining a Characteristic of...

Metrology System and Method For Determining a Characteristic of One...