Vashishth Dudhia

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Ahmedabad, IN

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Patents Grantslast 30 patents

Information Patent Grant
Cascaded radar system calibration of baseband imbalances
- Patent number 12,078,749
- Issue date Sep 3, 2024
- Texas Instruments Incorporated
- Karthik Subburaj
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus to test RADAR integrated circuits
- Patent number 11,899,129
- Issue date Feb 13, 2024
- Texas Instruments Incorporated
- Karthik Subburaj
- G01 - MEASURING TESTING
Information Patent Grant
Cascaded radar system calibration of baseband imbalances
- Patent number 11,630,185
- Issue date Apr 18, 2023
- Texas Instruments Incorporated
- Karthik Subburaj
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus to test radar integrated circuits
- Patent number 11,513,190
- Issue date Nov 29, 2022
- Texas Instruments Incorporated
- Karthik Subburaj
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FMCW RADAR SYSTEM WITH CHIRP JITTER REDUCTION
- Publication number 20250138148
- Publication date May 1, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Karthik Subburaj
- G01 - MEASURING TESTING
Information Patent Application
PHASE ADJUSTING FMCW RADAR SYSTEM
- Publication number 20230305132
- Publication date Sep 28, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Karthik Subburaj
- G01 - MEASURING TESTING
Information Patent Application
CASCADED RADAR SYSTEM CALIBRATION OF BASEBAND IMBALANCES
- Publication number 20230213615
- Publication date Jul 6, 2023
- TEXAS INSTRUMENTS INCORPORATED
- KARTHIK SUBBURAJ
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS TO TEST RADAR INTEGRATED CIRCUITS
- Publication number 20230088361
- Publication date Mar 23, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Karthik Subburaj
- G01 - MEASURING TESTING
Information Patent Application
CASCADED RADAR SYSTEM CALIBRATION OF BASEBAND IMBALANCES
- Publication number 20210149019
- Publication date May 20, 2021
- TEXAS INSTRUMENTS INCORPORATED
- KARTHIK SUBBURAJ
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS TO TEST RADAR INTEGRATED CIRCUITS
- Publication number 20200379085
- Publication date Dec 3, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Karthik Subburaj
- G01 - MEASURING TESTING