Vasu Ganti

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Los Altos, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Test circuit and methods for speed characterization
- Patent number 8,593,196
- Issue date Nov 26, 2013
- Apple Inc.
- Ravi Karapatti Ramaswami
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for AC scan testing with distributed capture a...
- Patent number 8,407,544
- Issue date Mar 26, 2013
- Advanced Micro Devices, Inc.
- Amitava Majumdar
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST CIRCUIT AND METHODS FOR SPEED CHARACTERIZATION
- Publication number 20130093488
- Publication date Apr 18, 2013
- Ravi Karapatti Ramaswami
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR AC SCAN TESTING WITH DISTRIBUTED CAPTURE A...
- Publication number 20110258505
- Publication date Oct 20, 2011
- Amitava Majumdar
- G01 - MEASURING TESTING