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Vaughn N. Hartung
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Reno, NV, US
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Patents Grants
last 30 patents
Information
Patent Grant
Methods for determining at least one property of a material
Patent number
11,709,142
Issue date
Jul 25, 2023
Nevada Nanotech Systems Inc.
Benjamin S. Rogers
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for determining at least one property of a mate...
Patent number
11,262,321
Issue date
Mar 1, 2022
Nevada Nanotech Systems Inc.
Benjamin S. Rogers
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for determining at least one property of a mate...
Patent number
11,226,299
Issue date
Jan 18, 2022
Nevada Nanotech Systems Inc.
Benjamin S. Rogers
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for determining at least one property of a mate...
Patent number
10,724,976
Issue date
Jul 28, 2020
Nevada Nanotech Systems Inc.
Benjamin S. Rogers
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS FOR DETERMINING AT LEAST ONE PROPERTY OF A MATERIAL
Publication number
20230304950
Publication date
Sep 28, 2023
Nevada Nanotech Systems Inc.
Benjamin S. Rogers
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF OPERATING AND CALIBRATING A GAS SENSOR, AND RELATED GAS...
Publication number
20220381731
Publication date
Dec 1, 2022
Nevada Nanotech Systems Inc.
Benjamin S. Rogers
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR DETERMINING AT LEAST ONE PROPERTY OF A MATE...
Publication number
20200363358
Publication date
Nov 19, 2020
Nevada Nanotech Systems Inc.
Benjamin S. Rogers
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR DETERMINING AT LEAST ONE PROPERTY OF A MATERIAL
Publication number
20200355636
Publication date
Nov 12, 2020
Nevada Nanotech Systems Inc.
Benjamin S. Rogers
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR DETERMINING AT LEAST ONE PROPERTY OF A MATE...
Publication number
20180052124
Publication date
Feb 22, 2018
Nevada Nanotech Systems Inc.
Benjamin S. Rogers
G01 - MEASURING TESTING