VENKAT K. KUCHIPUDI

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Scan or JTAG controllable capture clock generation
- Patent number 9,903,913
- Issue date Feb 27, 2018
- Advanced Micro Devices, Inc.
- Atchyuth Gorti
- G01 - MEASURING TESTING
Information Patent Grant
Scan-based reset
- Patent number 9,009,552
- Issue date Apr 14, 2015
- Advanced Micro Devices, Inc.
- Bill K. Kwan
- G01 - MEASURING TESTING
Information Patent Grant
Scan or JTAG controllable capture clock generation
- Patent number 8,633,725
- Issue date Jan 21, 2014
- Advanced Micro Devices, Inc.
- Atchyuth K. Gorti
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCAN OR JTAG CONTROLLABLE CAPTURE CLOCK GENERATION
- Publication number 20140359386
- Publication date Dec 4, 2014
- Advanced Micro Devices, Inc.
- Atchyuth Gorti
- G01 - MEASURING TESTING
Information Patent Application
LBIST DIAGNOSTIC SCHEME
- Publication number 20120124440
- Publication date May 17, 2012
- Atchyuth K. Gorti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCAN-BASED RESET
- Publication number 20120062283
- Publication date Mar 15, 2012
- Bill K. Kwan
- G01 - MEASURING TESTING
Information Patent Application
SCAN OR JTAG CONTROLLABLE CAPTURE CLOCK GENERATION
- Publication number 20120062266
- Publication date Mar 15, 2012
- ATCHYUTH K. GORTI
- G01 - MEASURING TESTING