Venkatesh Prasanna

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Folsom, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Accurate on-die temperature measurement using remote sensing
- Patent number 7,512,514
- Issue date Mar 31, 2009
- Intel Corporation
- David Duarte
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for accurate on-die temperature measurement
- Patent number 7,149,645
- Issue date Dec 12, 2006
- Intel Corporation
- Kedar Mangrulkar
- G01 - MEASURING TESTING
Information Patent Grant
Circuits and methods for alignment of signals in integrated circuits
- Patent number 6,891,417
- Issue date May 10, 2005
- Intel Corporation
- Tanveer R Khondker
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Accurate on-die temperature measurement using remote sensing
- Publication number 20080082282
- Publication date Apr 3, 2008
- David Duarte
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ACCURATE ON-DIE TEMPERATURE MEASUREMENT
- Publication number 20060161373
- Publication date Jul 20, 2006
- Intel Corporation
- Kedar Mangrulkar
- G01 - MEASURING TESTING
Information Patent Application
CIRCUITS AND METHODS FOR ALIGNMENT OF SIGNALS IN INTEGRATED CIRCUITS
- Publication number 20050001664
- Publication date Jan 6, 2005
- Intel Corporation
- Tanveer R. Khondker
- H03 - BASIC ELECTRONIC CIRCUITRY