Vernon L. Larrowe

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Ypsilanti, MI, US

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Patents Grantslast 30 patents

Information Patent Grant
Multispectral/spatial pattern recognition system
- Patent number 4,731,859
- Issue date Mar 15, 1988
- Environmental Research Institute of Michigan
- Marvin J. Holter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for extended precision phase measurement
- Patent number 4,636,719
- Issue date Jan 13, 1987
- Environmental Research Institute of Michigan
- David M. Zuk
- G01 - MEASURING TESTING