Viatcheslav B. Artaev

Person

St. Joseph, MI, US

People

Patents Grantslast 30 patents

Information Patent Grant
Two-stage ion source comprising closed and open ion volumes
- Patent number 11,328,919
- Issue date May 10, 2022
- Leco Corporation
- Viatcheslav Artaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time-of-flight mass spectrometer
- Patent number 11,158,495
- Issue date Oct 26, 2021
- Leco Corporation
- Viatcheslav Artaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting mass spectrometer with high throughput
- Patent number 10,741,377
- Issue date Aug 11, 2020
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting mass spectrometer with high throughput
- Patent number 10,593,534
- Issue date Mar 17, 2020
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting mass spectrometer with high throughput
- Patent number 10,211,039
- Issue date Feb 19, 2019
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting mass spectrometer with high throughput
- Patent number 9,881,780
- Issue date Jan 30, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data acquisition system for a spectrometer using an ion statistics...
- Patent number 9,184,035
- Issue date Nov 10, 2015
- Leco Corporation
- Peter Markel Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data acquisition system for a spectrometer using an ion statistics...
- Patent number 9,082,597
- Issue date Jul 14, 2015
- Leco Corporation
- Peter M. Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data acquisition system for a spectrometer using various filters
- Patent number 8,063,360
- Issue date Nov 22, 2011
- Leco Corporation
- Peter M. Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data acquisition system for a spectrometer that generates stick spe...
- Patent number 8,017,907
- Issue date Sep 13, 2011
- Leco Corporation
- Peter M. Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data acquisition system for a spectrometer
- Patent number 7,884,319
- Issue date Feb 8, 2011
- Leco Corporation
- Peter M. Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data acquisition system for a spectrometer using horizontal accumul...
- Patent number 7,825,373
- Issue date Nov 2, 2010
- Leco Corporation
- Peter M. Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data acquisition system for a spectrometer using an adaptive threshold
- Patent number 7,501,621
- Issue date Mar 10, 2009
- Leco Corporation
- Peter M. Willis
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Two-Stage Ion Source Comprising Closed and Open Ion Volumes
- Publication number 20210233760
- Publication date Jul 29, 2021
- Leco Corporation
- Viatcheslav Artaev
- G01 - MEASURING TESTING
Information Patent Application
Method for Ranking Library Hits in Mass Spectrometry
- Publication number 20210033577
- Publication date Feb 4, 2021
- Leco Corporation
- Viatcheslav Artaev
- G01 - MEASURING TESTING
Information Patent Application
MULTI-REFLECTING MASS SPECTROMETER WITH HIGH THROUGHPUT
- Publication number 20200185211
- Publication date Jun 11, 2020
- LECO CORPORATION
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Reflecting Time-of-Flight Mass Spectrometer
- Publication number 20200090919
- Publication date Mar 19, 2020
- Leco Corporation
- Viatcheslav Artaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Reflecting Mass Spectrometer with High Throughput
- Publication number 20190180999
- Publication date Jun 13, 2019
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Reflecting Mass Spectrometer with High Throughput
- Publication number 20180174816
- Publication date Jun 21, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Reflecting Mass Spectrometer With High Throughput
- Publication number 20160155624
- Publication date Jun 2, 2016
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Data Acquisition System for a Spectrometer Using an Ion Statistics...
- Publication number 20150279643
- Publication date Oct 1, 2015
- Leco Corporation
- Peter Markel Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Data Acquisition System for a Spectrometer Using an Ion Statistics...
- Publication number 20110284736
- Publication date Nov 24, 2011
- Peter M. Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA ACQUISITION SYSTEM FOR A SPECTROMETER
- Publication number 20090090861
- Publication date Apr 9, 2009
- Leco Corporation
- Peter M. Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Data Acquisition System for a Spectrometer Using Various Filters
- Publication number 20090072134
- Publication date Mar 19, 2009
- Peter M. Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA ACQUISITION SYSTEM FOR A SPECTROMETER USING HORIZONTAL ACCUMUL...
- Publication number 20090014642
- Publication date Jan 15, 2009
- Leco Corporation
- Peter M. Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Data Acquisition System for a Spectrometer that Generates Stick Spe...
- Publication number 20090014643
- Publication date Jan 15, 2009
- Peter M. Willis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Data Acquisition System and Method for a Spectrometer
- Publication number 20080029697
- Publication date Feb 7, 2008
- Peter M. Willis
- H01 - BASIC ELECTRIC ELEMENTS

Viatcheslav B. Artaev

Person

Patents Grantslast 30 patents

Two-stage ion source comprising closed and open ion volumes

Multi-reflecting time-of-flight mass spectrometer

Multi-reflecting mass spectrometer with high throughput

Multi-reflecting mass spectrometer with high throughput

Multi-reflecting mass spectrometer with high throughput

Multi-reflecting mass spectrometer with high throughput

Data acquisition system for a spectrometer using an ion statistics...

Data acquisition system for a spectrometer using an ion statistics...

Data acquisition system for a spectrometer using various filters

Data acquisition system for a spectrometer that generates stick spe...

Data acquisition system for a spectrometer

Data acquisition system for a spectrometer using horizontal accumul...

Data acquisition system for a spectrometer using an adaptive threshold

Patents Applicationslast 30 patents

Two-Stage Ion Source Comprising Closed and Open Ion Volumes

Method for Ranking Library Hits in Mass Spectrometry

MULTI-REFLECTING MASS SPECTROMETER WITH HIGH THROUGHPUT

Multi-Reflecting Time-of-Flight Mass Spectrometer

Multi-Reflecting Mass Spectrometer with High Throughput

Multi-Reflecting Mass Spectrometer with High Throughput

Multi-Reflecting Mass Spectrometer With High Throughput

Data Acquisition System for a Spectrometer Using an Ion Statistics...

Data Acquisition System for a Spectrometer Using an Ion Statistics...

DATA ACQUISITION SYSTEM FOR A SPECTROMETER

Data Acquisition System for a Spectrometer Using Various Filters

DATA ACQUISITION SYSTEM FOR A SPECTROMETER USING HORIZONTAL ACCUMUL...

Data Acquisition System for a Spectrometer that Generates Stick Spe...

Data Acquisition System and Method for a Spectrometer