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Vibheesh Bharathan
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Systems and method for always-on sensing user interface
Patent number
11,983,060
Issue date
May 14, 2024
Cypress Semiconductor Corporation
Vibheesh Bharathan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Always on low power capacitive matrix autonomous scan
Patent number
11,556,205
Issue date
Jan 17, 2023
Cypress Semiconductor Corporation
Vibheesh Bharathan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Always on low power capacitive matrix autonomous scan
Patent number
11,093,078
Issue date
Aug 17, 2021
Cypress Semiconductor Corporation
Vibheesh Bharathan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detect and differentiate touches from different size conductive obj...
Patent number
10,352,977
Issue date
Jul 16, 2019
Cypress Semiconductor Corporation
Vibheesh Bharathan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detect and differentiate touches from different size conductive obj...
Patent number
10,302,683
Issue date
May 28, 2019
Cypress Semiconductor Corporation
Vibheesh Bharathan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Quasi-differential mutual capacitance measurement
Patent number
9,983,246
Issue date
May 29, 2018
Cypress Semiconductor Corporation
Vibheesh Bharathan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detect and differentiate touches from different size conductive obj...
Patent number
9,910,077
Issue date
Mar 6, 2018
Cypress Semiconductor Corporation
Vibheesh Bharathan
G01 - MEASURING TESTING
Information
Patent Grant
Detect and differentiate touches from different size conductive obj...
Patent number
9,746,507
Issue date
Aug 29, 2017
Cypress Semiconductor Corporation
Vibheesh Bharathan
G01 - MEASURING TESTING
Information
Patent Grant
Detect and differentiate touches from different size conductive obj...
Patent number
8,823,399
Issue date
Sep 2, 2014
Cypress Semiconductor Corporation
Vibheesh Bharathan
G01 - MEASURING TESTING
Information
Patent Grant
Multi-frequency scan for multi-sensor electrode
Patent number
8,547,118
Issue date
Oct 1, 2013
Cypress Semiconductor Corporation
Santhosh Kumar Vojjala
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
CAPACITIVE SENSOR
Publication number
20250110594
Publication date
Apr 3, 2025
CYPRESS SEMICONDUCTOR CORPORATION
Vibheesh BHARATHAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Systems and Method for Always-on Sensing User Interface
Publication number
20230122105
Publication date
Apr 20, 2023
CYPRESS SEMICONDUCTOR CORPORATION
Vibheesh BHARATHAN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CAPACITIVE DIFFERENTIAL ROTARY ENCODER
Publication number
20220244078
Publication date
Aug 4, 2022
CYPRESS SEMICONDUCTOR CORPORATION
Brendan McAndrews
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ALWAYS ON LOW POWER CAPACITIVE MATRIX AUTONOMOUS SCAN
Publication number
20220113855
Publication date
Apr 14, 2022
CYPRESS SEMICONDUCTOR CORPORATION
Vibheesh Bharathan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM LEVEL SIMULATION AND EVALUATION OF CAPACITIVE AND INDUCTIVE...
Publication number
20210081590
Publication date
Mar 18, 2021
CYPRESS SEMICONDUCTOR CORPORATION
Vibheesh Bharathan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETECT AND DIFFERENTIATE TOUCHES FROM DIFFERENT SIZE CONDUCTIVE OBJ...
Publication number
20180164359
Publication date
Jun 14, 2018
CYPRESS SEMICONDUCTOR CORPORATION
Vibheesh Bharathan
G01 - MEASURING TESTING
Information
Patent Application
DETECT AND DIFFERENTIATE TOUCHES FROM DIFFERENT SIZE CONDUCTIVE OBJ...
Publication number
20180003752
Publication date
Jan 4, 2018
CYPRESS SEMICONDUCTOR CORPORATION
Vibheesh Bharathan
G01 - MEASURING TESTING
Information
Patent Application
Quasi-differential Mutual Capacitance Measurement
Publication number
20170205453
Publication date
Jul 20, 2017
CYPRESS SEMICONDUCTOR CORPORATION
Vibheesh Bharathan
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS, METHODS, AND DEVICES FOR TOUCH EVENT AND HOVER EVENT DETEC...
Publication number
20160154507
Publication date
Jun 2, 2016
CYPRESS SEMICONDUCTOR CORPORATION
Vibheesh Bharathan
G06 - COMPUTING CALCULATING COUNTING