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Vicky Svidenko
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Sunnyvale, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for determining factors for design considerati...
Patent number
8,924,904
Issue date
Dec 30, 2014
Applied Materials, Inc.
Vicky Svidenko
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inline defect analysis for sampling and SPC
Patent number
8,799,831
Issue date
Aug 5, 2014
Applied Materials, Inc.
Youval Nehmadi
G01 - MEASURING TESTING
Information
Patent Grant
Solar parametric testing module and processes
Patent number
8,049,521
Issue date
Nov 1, 2011
Applied Materials, Inc.
Danny Cam Toan Lu
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Stage yield prediction
Patent number
7,962,864
Issue date
Jun 14, 2011
Applied Materials, Inc.
Youval Nehmadi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scribe process monitoring methodology
Patent number
7,956,337
Issue date
Jun 7, 2011
Applied Materials, Inc.
Vicky Svidenko
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Dynamic inline yield analysis and prediction of a defect limited yi...
Patent number
7,937,179
Issue date
May 3, 2011
Applied Materials, Inc.
Rinat Shimshi
G05 - CONTROLLING REGULATING
Information
Patent Grant
System and method for performing post-plating morphological Cu grai...
Patent number
7,844,101
Issue date
Nov 30, 2010
Applied Materials Israel, Ltd.
Vicky Svidenko
G01 - MEASURING TESTING
Information
Patent Grant
Grouping systematic defects with feedback from electrical inspection
Patent number
7,760,929
Issue date
Jul 20, 2010
Applied Materials, Inc.
Jacob J. Orbon
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Design-based method for grouping systematic defects in lithography...
Patent number
7,760,347
Issue date
Jul 20, 2010
Applied Materials, Inc.
Youval Nehmadi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
INLINE DETECTION OF SUBSTRATE POSITIONING DURING PROCESSING
Publication number
20110117680
Publication date
May 19, 2011
Applied Materials, Inc.
Vicky SVIDENKO
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
METROLOGY AND INSPECTION SUITE FOR A SOLAR PRODUCTION LINE
Publication number
20100197051
Publication date
Aug 5, 2010
Applied Materials, Inc.
Asaf Schlezinger
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
LIGHT SOAKING SYSTEM AND TEST METHOD FOR SOLAR CELLS
Publication number
20100073011
Publication date
Mar 25, 2010
Applied Materials, Inc.
Vicky Svidenko
F21 - LIGHTING
Information
Patent Application
SCRIBE PROCESS MONITORING METHODOLOGY
Publication number
20100059693
Publication date
Mar 11, 2010
APPLIED MATERIALS, INC.
Vicky SVIDENKO
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
SOLAR PARAMETRIC TESTING MODULE AND PROCESSES
Publication number
20090256581
Publication date
Oct 15, 2009
Applied Materials, Inc.
Danny Cam Toan Lu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHOTOVOLTAIC FABRICATION PROCESS MONITORING AND CONTROL USING DIAGN...
Publication number
20090104342
Publication date
Apr 23, 2009
APPLIED MATERIALS, INC.
Dapeng Wang
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Stage yield prediction
Publication number
20080295047
Publication date
Nov 27, 2008
Youval Nehmadi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Inline defect analysis for sampling and SPC
Publication number
20080295048
Publication date
Nov 27, 2008
Youval Nehmadi
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for determining factors for design considerati...
Publication number
20080295063
Publication date
Nov 27, 2008
Vicky Svidenko
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Dynamic inline yield analysis and prediction
Publication number
20080294281
Publication date
Nov 27, 2008
Rinat Shimshi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
GROUPING SYSTEMATIC DEFECTS WITH FEEDBACK FROM ELECTRICAL INSPECTION
Publication number
20070052963
Publication date
Mar 8, 2007
JACOB J. ORBON
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
System and method for performing post-plating morphological Cu grai...
Publication number
20060274931
Publication date
Dec 7, 2006
Vicky Svidenko
G01 - MEASURING TESTING
Information
Patent Application
DESIGN-BASED METHOD FOR GROUPING SYSTEMATIC DEFECTS IN LITHOGRAPHY...
Publication number
20060269120
Publication date
Nov 30, 2006
YOUVAL NEHMADI
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY