Victor A. Scheff

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Alameda, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Inspection system with in-lens, off-axis illuminator
- Patent number 5,428,442
- Issue date Jun 27, 1995
- Optical Specialties, Inc.
- Lawrence H. Lin
- G02 - OPTICS
Information Patent Grant
Spatial filter for optically based defect inspection system
- Patent number 5,172,000
- Issue date Dec 15, 1992
- Insystems, Inc.
- Victor A. Scheff
- G02 - OPTICS