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Victor Chih Yuan Chang
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Hsin-Chu, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Accurate capacitance measurement for ultra large scale integrated c...
Patent number
8,115,500
Issue date
Feb 14, 2012
Taiwan Semiconductor Manufacturing Company, Ltd.
Yih-Yuh Doong
G01 - MEASURING TESTING
Information
Patent Grant
Accurate capacitance measurement for ultra large scale integrated c...
Patent number
7,880,494
Issue date
Feb 1, 2011
Taiwan Semiconductor Manufacturing Company, Ltd.
Yih-Yuh Doong
G01 - MEASURING TESTING
Information
Patent Grant
Accurate capacitance measurement for ultra large scale integrated c...
Patent number
7,772,868
Issue date
Aug 10, 2010
Taiwan Semiconductor Manufacturing Company, Ltd.
Yih-Yuh Doong
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Accurate Capacitance Measurement for Ultra Large Scale Integrated C...
Publication number
20110168995
Publication date
Jul 14, 2011
Taiwan Semiconductor Manufacturing Company, Ltd.
Yih-Yuh Doong
G01 - MEASURING TESTING
Information
Patent Application
Accurate Capacitance Measurement for Ultra Large Scale Integrated C...
Publication number
20100156453
Publication date
Jun 24, 2010
Taiwan Semiconductor Manufacturing Company, Ltd.
Yih-Yuh Doong
G01 - MEASURING TESTING
Information
Patent Application
Accurate Capacitance Measurement for Ultra Large Scale Integrated C...
Publication number
20090002012
Publication date
Jan 1, 2009
Yih-Yuh Doong
G01 - MEASURING TESTING