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Victor Emanuel CALADO
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Rotterdam, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Determining an optimal operational parameter setting of a metrology...
Patent number
11,320,750
Issue date
May 3, 2022
ASML Netherlands B.V.
Leon Paul Van Dijk
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method to change an etch parameter
Patent number
11,300,887
Issue date
Apr 12, 2022
ASML Netherlands B.V.
Richard Johannes Franciscus Van Haren
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Metrology using a plurality of metrology target measurement recipes
Patent number
11,187,995
Issue date
Nov 30, 2021
ASML Netherlands B.V.
Victor Emanuel Calado
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Determining an optimal operational parameter setting of a metrology...
Patent number
10,788,761
Issue date
Sep 29, 2020
ASML Netherlands B.V.
Leon Paul Van Dijk
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of measuring a property of a substrate, inspection apparatus...
Patent number
10,474,043
Issue date
Nov 12, 2019
ASML Netherlands B.V.
Patrick Warnaar
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Lithographic apparatus and device manufacturing method
Patent number
10,474,045
Issue date
Nov 12, 2019
ASML Netherlands B.V.
Franciscus Godefridus Casper Bijnen
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Metrology method and apparatus, substrates for use in such methods,...
Patent number
10,162,272
Issue date
Dec 25, 2018
ASML Netherlands B.V.
Martin Jacobus Johan Jak
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
A SUBSTRATE COMPRISING A TARGET ARRANGEMENT, AND ASSOCIATED AT LEAS...
Publication number
20230176491
Publication date
Jun 8, 2023
ASML NETHERLANDS B.V.
Olger Victor ZWIER
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METROLOGY USING A PLURALITY OF METROLOGY TARGET MEASUREMENT RECIPES
Publication number
20210208512
Publication date
Jul 8, 2021
ASML NETHERLANDS B.V.
Victor Emanuel CALADO
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
DETERMINING AN OPTIMAL OPERATIONAL PARAMETER SETTING OF A METROLOGY...
Publication number
20210018852
Publication date
Jan 21, 2021
ASML NETHERLANDS B.V.
Leon Paul VAN DIJK
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
A DEVICE MANUFACTURING METHOD AND A COMPUTER PROGRAM PRODUCT
Publication number
20200159128
Publication date
May 21, 2020
ASML NETHERLANDS B.V.
Victor Emanuel CALADO
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF DETERMINING PELLICLE COMPENSATION CORRECTIONS FOR A LITHO...
Publication number
20190294059
Publication date
Sep 26, 2019
ASML NETHERLANDS B.V.
Leon Paul VAN DIJK
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
A METHOD TO CHANGE AN ETCH PARAMETER
Publication number
20190285992
Publication date
Sep 19, 2019
ASML NETHERLANDS B.V.
Richard Johannes Franciscus VAN HAREN
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
DETERMINING AN OPTIMAL OPERATIONAL PARAMETER SETTING OF A METROLOGY...
Publication number
20190250523
Publication date
Aug 15, 2019
ASML NETHERLANDS B.V.
Leon Paul VAN DIJK
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method of Measuring a Property of a Substrate, Inspection Apparatus...
Publication number
20180173105
Publication date
Jun 21, 2018
ASML NETHERLANDS B.V.
Patrick Warnaar
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METROLOGY METHOD AND APPARATUS, SUBSTRATES FOR USE IN SUCH METHODS,...
Publication number
20170052454
Publication date
Feb 23, 2017
ASML NETHERLANDS B.V.
Martin Jacobus Johan JAK
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY