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Victor Higgs
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Hertfordshire, GB
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Patents Grants
last 30 patents
Information
Patent Grant
Detection method and apparatus metal particulates on semiconductors
Patent number
7,589,834
Issue date
Sep 15, 2009
Nanometrics Incorporated
Victor Higgs
G01 - MEASURING TESTING
Information
Patent Grant
Micro defects in semi-conductors
Patent number
7,446,868
Issue date
Nov 4, 2008
Nanometrics Incorporated
Victor Higgs
G01 - MEASURING TESTING
Information
Patent Grant
Micro defects in semi-conductors
Patent number
7,113,276
Issue date
Sep 26, 2006
ASTI Operating Company, Inc.
Victor Higgs
G01 - MEASURING TESTING
Information
Patent Grant
Detection and classification of micro-defects in semi-conductors
Patent number
7,098,052
Issue date
Aug 29, 2006
Aoti Operating Company, Inc.
Victor Higgs
G01 - MEASURING TESTING
Information
Patent Grant
Method to detect surface metal contamination
Patent number
6,911,347
Issue date
Jun 28, 2005
Aoti Operating Company, Inc.
Victor Higgs
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Detection method and apparatus metal praticulates on semiconductors
Publication number
20060262296
Publication date
Nov 23, 2006
Victor Higgs
G01 - MEASURING TESTING
Information
Patent Application
Method to detect surface metal contamination
Publication number
20040106217
Publication date
Jun 3, 2004
Victor Higgs
G01 - MEASURING TESTING
Information
Patent Application
Detection and classification of micro-defects in semi-conductors
Publication number
20040092042
Publication date
May 13, 2004
Victor Higgs
G01 - MEASURING TESTING