Victor Landa

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Ladera Ranch, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Test socket assembly with antenna and related methods
- Patent number 11,662,363
- Issue date May 30, 2023
- Xcerra Corporation
- Jason Mroczkowski
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit chip tester with an anti-rotation link
- Patent number 9,425,529
- Issue date Aug 23, 2016
- Xcerra Corporation
- Victor Landa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit (IC) test socket using Kelvin bridge
- Patent number 9,354,251
- Issue date May 31, 2016
- Titan Semiconductor Tool, LLC
- Victor Landa
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit chip tester with embedded micro link
- Patent number 9,343,830
- Issue date May 17, 2016
- Xcerra Corporation
- Victor Landa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit (IC) test socket with Faraday cage
- Patent number 9,188,605
- Issue date Nov 17, 2015
- Xcerra Corporation
- Victor Landa
- G01 - MEASURING TESTING
Information Patent Grant
Socket mount
- Patent number 8,998,621
- Issue date Apr 7, 2015
- Titan Semiconductor Tool, LLC
- Victor Landa
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit (IC) socket with contoured capture groove
- Patent number 8,758,027
- Issue date Jun 24, 2014
- Titan Semiconductor Tool, LLC
- Victor Landa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TEST SOCKET ASSEMBLY WITH ANTENNA AND RELATED METHODS
- Publication number 20210364547
- Publication date Nov 25, 2021
- XCERRA CORPORATION
- Jason Mroczkowski
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT CHIP TESTER WITH AN ANTI-ROTATION LINK
- Publication number 20150372407
- Publication date Dec 24, 2015
- Titan Semiconductor Tool, LLC
- Victor Landa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT (IC) TEST SOCKET USING KELVIN BRIDGE
- Publication number 20150241474
- Publication date Aug 27, 2015
- Titan Semiconductor Tool, LLC
- Victor Landa
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT (IC) TEST SOCKET WITH FARADAY CAGE
- Publication number 20150130487
- Publication date May 14, 2015
- Titan Semiconductor Tool, LLC
- Victor Landa
- G01 - MEASURING TESTING
Information Patent Application
SOCKET MOUNT
- Publication number 20140235096
- Publication date Aug 21, 2014
- Titan Semiconductor Tool, LLC
- Victor Landa
- G01 - MEASURING TESTING