Victor Liu

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Optical metrology model optimization for repetitive structures
- Patent number 7,355,728
- Issue date Apr 8, 2008
- Timbre Technologies, Inc.
- Shifang Li
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL METROLOGY MODEL OPTIMIZATION FOR REPETITIVE STRUCTURES
- Publication number 20080195342
- Publication date Aug 14, 2008
- Timbre Technologies, Inc.
- Shifang Li
- G01 - MEASURING TESTING
Information Patent Application
Optical metrology model optimization for repetitive structures
- Publication number 20060290947
- Publication date Dec 28, 2006
- Timbre Technologies, Inc.
- Shifang Li
- G01 - MEASURING TESTING